[x]
Thrust/Theme
TT – Test & Testability
|
| 1 through 24 of
24 similar documents, best matches first. |
|
- 1:
Software-Based Self-Test and Diagnosis Using on-Chip Memory ...
- Software-Based Self-Test and Diagnosis Using on-Chip Memory Application Type: Divisional Patent Number: 10788532 Country: United States Status: Filed on 30-Nov-2017, Issued on ...
URL: https://www.src.org/library/patent/p1753/
Modified: 2020-09-29 - 26KB
Find Similar Documents
- 2:
Software-Based Self-Test and Diagnosis Using on-Chip Memory ...
- Software-Based Self-Test and Diagnosis Using on-Chip Memory Application Type: Divisional Patent Number: 10845416 Country: United States Status: Filed on 30-Nov-2017, Issued on ...
URL: https://www.src.org/library/patent/p1752/
Modified: 2020-11-24 - 26KB
Find Similar Documents
- 3:
Software-Based Self-Test and Diagnosis Using On-Chip Memory ...
- Software-Based Self-Test and Diagnosis Using On-Chip Memory Application Type: Utility Patent Number: 9864007 Country: United States Status: Filed on 30-Apr-2014, Issued on ...
URL: https://www.src.org/library/patent/p1457/
Modified: 2018-01-09 - 25KB
Find Similar Documents
- 4:
Cost Effective DAC Linearization System (Patent P1749) - SRC
- Cost Effective DAC Linearization System Application Type: Utility Patent Number: 10218371 Country: United States Status: Filed on 1-Mar-2018, Issued on 26-Feb-2019 Organization: ...
URL: https://www.src.org/library/patent/p1749/
Modified: 2019-02-26 - 28KB
Find Similar Documents
- 5:
Scan Test of Die Logic in 3D ICs Using TSV Probing (Patent P1368...
- Scan Test of Die Logic in 3D ICs Using TSV Probing Application Type: Utility Patent Number: 8782479 Country: United States Status: Filed on 1-Nov-2012, Issued on 15-Jul-2014, ...
URL: https://www.src.org/library/patent/p1368/
Modified: 2014-07-15 - 22KB
Find Similar Documents
- 6:
Characterization Of Radio Frequency (RF) Signals Using Wavelet...
- Characterization Of Radio Frequency (RF) Signals Using Wavelet-Based Parameter Extraction Application Type: Utility Patent Number: 7340381 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0325/
Modified: 2008-03-04 - 23KB
Find Similar Documents
- 7:
Signal Tracing Using On-Chip Memory For In-System Post-Fabrication...
- Signal Tracing Using On-Chip Memory For In-System Post-Fabrication Debug Application Type: Utility Patent Number: 9720036 Country: United States Status: Filed on 18-Aug-2014, ...
URL: https://www.src.org/library/patent/p1495/
Modified: 2017-08-01 - 23KB
Find Similar Documents
- 8:
Signal Tracing using ON-Chip Memory for In-System Post-Fabrication...
- Signal Tracing using ON-Chip Memory for In-System Post-Fabrication Debug Application Type: Continuation Patent Number: 10732221 Country: United States Status: Filed on 26-Jun-2017, ...
URL: https://www.src.org/library/patent/p1733/
Modified: 2020-08-04 - 24KB
Find Similar Documents
- 9:
Non-Invasive Pre-Bond TSV TestUsing Ring Oscillators and Multiple...
- Non-Invasive Pre-Bond TSV TestUsing Ring Oscillators and Multiple Voltage Levels Application Type: Utility Patent Number: 9478720 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1392/
Modified: 2016-11-01 - 24KB
Find Similar Documents
- 10:
Retiming-Based Design Flow for Delay Recovery on Inter-Die Paths...
- Retiming-Based Design Flow for Delay Recovery on Inter-Die Paths in 3D ICs Application Type: Utility Patent Number: 8832608 Country: United States Status: Filed on 17-Jun-2013, ...
URL: https://www.src.org/library/patent/p1411/
Modified: 2014-09-09 - 22KB
Find Similar Documents
- 11:
Power Switch Design and Method for Reducing Leakage Power in...
- Power Switch Design and Method for Reducing Leakage Power in Low-Power Integrated Circuits Application Type: Utility Patent Number: 8373493 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1239/
Modified: 2013-02-12 - 22KB
Find Similar Documents
- 12:
Charge-Based Frequency Measurement BIST (Patent P0185) - SRC
- Charge-Based Frequency Measurement BIST Application Type: Utility Patent Number: 6885700 Country: United States Status: Filed on 23-Sep-1999, Issued on 26-Apr-2005, Patent ...
URL: https://www.src.org/library/patent/p0185/
Modified: 2005-04-26 - 24KB
Find Similar Documents
- 13:
Method for Testing Analog and Mixed-Signal Circuits Using Functionally...
- Method for Testing Analog and Mixed-Signal Circuits Using Functionally Related Excitations and Functionally Related Measurements Application Type: Utility Patent Number: 7129734 ...
URL: https://www.src.org/library/patent/p0458/
Modified: 2006-10-31 - 25KB
Find Similar Documents
- 14:
Method for Testing Analog and Mixed-Signal Circuits Using Dynamic...
- Method for Testing Analog and Mixed-Signal Circuits Using Dynamic Element Matching for Source Linearization Application Type: Utility Patent Number: 7587647 Country: United States ...
URL: https://www.src.org/library/patent/p0468/
Modified: 2009-09-08 - 23KB
Find Similar Documents
- 15:
Charge-Based Frequency Measurement BIST (Patent P0557) - SRC
- Charge-Based Frequency Measurement BIST Application Type: European Patent Office Patent Number: 1214605 Status: Filed on 19-Jun-2002, Issued on 22-Mar-2006 Organization: University ...
URL: https://www.src.org/library/patent/p0557/
Modified: 2006-03-22 - 23KB
Find Similar Documents
- 16:
Non-Invasive Pre-Bond TSV Test using Ring Oscillators and Multiple...
- Non-Invasive Pre-Bond TSV Test using Ring Oscillators and Multiple Voltage Levels Application Type: Continuation Patent Number: 10444279 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1635/
Modified: 2019-10-15 - 23KB
Find Similar Documents
- 17:
Methods for Characterizing, Generating Test Sequences for, and...
- Methods for Characterizing, Generating Test Sequences for, and Simulating Integrated Circuit Faults Using Fault Tuples and Related Systems and Computer Program Products Application ...
URL: https://www.src.org/library/patent/p0228/
Modified: 2004-12-28 - 22KB
Find Similar Documents
- 18:
Signal Generator with Self-Calibration (Patent P1736) - SRC
- Signal Generator with Self-Calibration Application Type: Utility Patent Number: 10116317 Country: United States Status: Filed on 15-Nov-2017, Issued on 30-Oct-2018 Organization: ...
URL: https://www.src.org/library/patent/p1736/
Modified: 2018-10-30 - 24KB
Find Similar Documents
- 19:
Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
- Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Utility Patent Number: 10338133 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p1639/
Modified: 2019-07-02 - 25KB
Find Similar Documents
- 20:
Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
- Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Continuation (in part) Patent Number: 10838003 Country: United States ...
URL: https://www.src.org/library/patent/p1826/
Modified: 2020-11-17 - 25KB
Find Similar Documents
- 21:
India Design Review (Event E005563) - SRC
- India Design Review Date: Wednesday, Jan. 7, 2015, 6 p.m. - Thursday, Jan. 8, 2015, 5 p.m. Local Location: Hyatt Bangalore, 1/1, Swami Vivekananda Road, Off M.G. Road, Ulsoor, ...
URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB
Find Similar Documents
- 22:
Receiver With Colpitts Differential Oscillator, Colpitts Quadrature...
- Receiver With Colpitts Differential Oscillator, Colpitts Quadrature Oscillator, and Common-Gate Low Noise Amplifier Application Type: Divisional Patent Number: 7755442 Country: ...
URL: https://www.src.org/library/patent/p1100/
Modified: 2010-07-13 - 24KB
Find Similar Documents
- 23:
Receiver With Colpitts Differential Oscillator, Colpitts Quadrature...
- Receiver With Colpitts Differential Oscillator, Colpitts Quadrature Oscillator, And Common-Gate Low Noise Amplifier Application Type: Utility Patent Number: 7414481 Country: United ...
URL: https://www.src.org/library/patent/p0560/
Modified: 2008-08-19 - 24KB
Find Similar Documents
- 24:
Method for Diagnosing Bridging Faults in Integrated Circuits...
- Method for Diagnosing Bridging Faults in Integrated Circuits Application Type: Continuation (in part) Patent Number: 6560736 Country: United States Status: Filed on 10-Jan-2001, ...
URL: https://www.src.org/library/patent/p0338/
Modified: 2003-05-06 - 23KB
Find Similar Documents
| 1 through 24 of
24 similar documents, best matches first. |
|
|
|
