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Thrust/Theme
CADT – Computer-Aided Design and Test
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8 similar documents, best matches first. |
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- 1:
Cost Effective DAC Linearization System (Patent P1749) - SRC
- Cost Effective DAC Linearization System Application Type: Utility Patent Number: 10218371 Country: United States Status: Filed on 1-Mar-2018, Issued on 26-Feb-2019 Organization: ...
URL: https://www.src.org/library/patent/p1749/
Modified: 2019-02-26 - 28KB
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- 2:
 Nxp corporate template, public
- SANJAY GUPTA Vice President & India Country Manager NXP Semiconductors Autonomous Vehicles Robots on Wheels 10 JANUARY, 2019 NXP SEMICONDUCTORS 01. SECURE CONNECTIONS FOR A SMARTER ...
URL: https://www.src.org/...ar/e006592/autonomous_cars_sgupta.pdf
Modified: 2019-03-20 - 5.5MB
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- 3:
Computer-Aided Design and Test Poster Session - May 14th - SRC
- Computer-Aided Design and Test Annual Review Poster Session May 14th Posters Presentation 1 Yanzhao Wang, Portland State Equivalence Checking for HLS Accelerators Design ...
URL: https://www.src.org/calendar/e007211/cadt/posters/day2/
Modified: 2021-05-20 - 25KB
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- 4:
Signal Generator with Self-Calibration (Patent P1736) - SRC
- Signal Generator with Self-Calibration Application Type: Utility Patent Number: 10116317 Country: United States Status: Filed on 15-Nov-2017, Issued on 30-Oct-2018 Organization: ...
URL: https://www.src.org/library/patent/p1736/
Modified: 2018-10-30 - 24KB
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- 5:
Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
- Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Utility Patent Number: 10338133 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p1639/
Modified: 2019-07-02 - 25KB
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- 6:
Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
- Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Continuation (in part) Patent Number: 10838003 Country: United States ...
URL: https://www.src.org/library/patent/p1826/
Modified: 2020-11-17 - 25KB
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- 7:
India Design Review (Event E005563) - SRC
- India Design Review Date: Wednesday, Jan. 7, 2015, 6 p.m. - Thursday, Jan. 8, 2015, 5 p.m. Local Location: Hyatt Bangalore, 1/1, Swami Vivekananda Road, Off M.G. Road, Ulsoor, ...
URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB
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- 8:
Apparatus for Detecting Bugs in Logic-Based Processing Devices...
- Apparatus for Detecting Bugs in Logic-Based Processing Devices Application Type: Utility Patent Number: 10120737 Country: United States Status: Filed on 18-Feb-2016, Issued on ...
URL: https://www.src.org/library/patent/p1597/
Modified: 2018-11-06 - 23KB
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