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GRC Science Area
CADTS – Computer Aided Design & Test Sciences
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- 1:
TECHCON 2013 (Event E004683) - SRC
- TECHCON 2013 Date: Monday, Sept. 9, 2013, 8 a.m. - Tuesday, Sept. 10, 2013, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004683 E004683 image ...
URL: https://www.src.org/calendar/e004683/
Modified: 2014-03-10 - 136KB
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- 2:
TECHCON 2012 (Event E004114) - SRC
- TECHCON 2012 Date: Monday, Sept. 10, 2012, 8 a.m. - Tuesday, Sept. 11, 2012, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004114 E004114 ...
URL: https://www.src.org/calendar/e004114/
Modified: 2013-03-11 - 98KB
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- 3:
TECHCON 2011 (Event E004113) - SRC
- TECHCON 2011 Date: Monday, Sept. 12, 2011, 8 a.m. - Tuesday, Sept. 13, 2011, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004113 E004113 ...
URL: https://www.src.org/calendar/e004113/
Modified: 2012-03-13 - 97KB
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- 4:
 Final Report - Workshop on Failure and Uncertainty in Mixed-Signal...
- National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB
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- 5:
Cost Effective DAC Linearization System (Patent P1749) - SRC
- Cost Effective DAC Linearization System Application Type: Utility Patent Number: 10218371 Country: United States Status: Filed on 1-Mar-2018, Issued on 26-Feb-2019 Organization: ...
URL: https://www.src.org/library/patent/p1749/
Modified: 2019-02-26 - 28KB
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- 6:
Method for Testing Analog and Mixed-Signal Circuits Using Functionally...
- Method for Testing Analog and Mixed-Signal Circuits Using Functionally Related Excitations and Functionally Related Measurements Application Type: Utility Patent Number: 7129734 ...
URL: https://www.src.org/library/patent/p0458/
Modified: 2006-10-31 - 25KB
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- 7:
Method for Testing Analog and Mixed-Signal Circuits Using Dynamic...
- Method for Testing Analog and Mixed-Signal Circuits Using Dynamic Element Matching for Source Linearization Application Type: Utility Patent Number: 7587647 Country: United States ...
URL: https://www.src.org/library/patent/p0468/
Modified: 2009-09-08 - 23KB
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- 8:
Characterization Of Radio Frequency (RF) Signals Using Wavelet...
- Characterization Of Radio Frequency (RF) Signals Using Wavelet-Based Parameter Extraction Application Type: Utility Patent Number: 7340381 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0325/
Modified: 2008-03-04 - 23KB
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- 9:
Method and Apparatus for Sampling and Predicting Rare Events...
- Method and Apparatus for Sampling and Predicting Rare Events in Complex Electronic Devices, Circuits and Systems Application Type: Utility Patent Number: 8155938 Country: United ...
URL: https://www.src.org/library/patent/p1078/
Modified: 2012-04-10 - 24KB
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- 10:
Method and Apparatus For Rapidly Modeling and Simulating Intra...
- Method and Apparatus For Rapidly Modeling and Simulating Intra-Die Statistical Variations in Integrated Circuits using Compressed Parameter Models Application Type: Utility Patent ...
URL: https://www.src.org/library/patent/p1160/
Modified: 2012-10-16 - 24KB
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- 11:
Signal Generator with Self-Calibration (Patent P1736) - SRC
- Signal Generator with Self-Calibration Application Type: Utility Patent Number: 10116317 Country: United States Status: Filed on 15-Nov-2017, Issued on 30-Oct-2018 Organization: ...
URL: https://www.src.org/library/patent/p1736/
Modified: 2018-10-30 - 24KB
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- 12:
Charge-Based Frequency Measurement BIST (Patent P0557) - SRC
- Charge-Based Frequency Measurement BIST Application Type: European Patent Office Patent Number: 1214605 Status: Filed on 19-Jun-2002, Issued on 22-Mar-2006 Organization: University ...
URL: https://www.src.org/library/patent/p0557/
Modified: 2006-03-22 - 23KB
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- 13:
Charge-Based Frequency Measurement BIST (Patent P0185) - SRC
- Charge-Based Frequency Measurement BIST Application Type: Utility Patent Number: 6885700 Country: United States Status: Filed on 23-Sep-1999, Issued on 26-Apr-2005, Patent ...
URL: https://www.src.org/library/patent/p0185/
Modified: 2005-04-26 - 24KB
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- 14:
Embedded IC Test Circuits and Methods (Patent P0525) - SRC
- Embedded IC Test Circuits and Methods Application Type: Utility Patent Number: 7379716 Country: United States Status: Filed on 24-Mar-2005, Issued on 27-May-2008, Patent Abandoned ...
URL: https://www.src.org/library/patent/p0525/
Modified: 2008-05-27 - 23KB
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- 15:
Constant Transconductance Bias Circuit and Method (Patent P0044...
- Constant Transconductance Bias Circuit and Method Application Type: Utility Patent Number: 5384548 Country: United States Status: Filed on 25-Aug-1993, Issued on 24-Jan-1995, ...
URL: https://www.src.org/library/patent/p0044/
Modified: 1995-01-24 - 21KB
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- 16:
Asynchronous Finite State Machines (Patent P1610) - SRC
- Asynchronous Finite State Machines Application Type: Utility Patent Number: 10310994 Country: United States Status: Filed on 28-Feb-2017, Issued on 4-Jun-2019 Organization: ...
URL: https://www.src.org/library/patent/p1610/
Modified: 2019-06-04 - 22KB
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- 17:
Method and Apparatus for High Speed Digital Sampling of a Data...
- Method and Apparatus for High Speed Digital Sampling of a Data Signal Application Type: Utility Patent Number: 5229668 Country: United States Status: Filed on 25-Mar-1992, Issued ...
URL: https://www.src.org/library/patent/p0135/
Modified: 1993-07-20 - 21KB
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- 18:
Method and System for Synthesizing Relative Timing Constraints...
- Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification Application Type: Utility Patent Number: 8239796 ...
URL: https://www.src.org/library/patent/p1202/
Modified: 2012-08-07 - 24KB
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- 19:
Method and System for Systematic Defect Identification (Patent...
- Method and System for Systematic Defect Identification Application Type: Utility Patent Number: 8509517 Country: United States Status: Filed on 29-Dec-2010, Issued on 13-Aug-2013 ...
URL: https://www.src.org/library/patent/p1262/
Modified: 2013-08-13 - 23KB
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- 20:
Method for Correcting a Mask Design Layout (Patent P1016) - SRC
- Method for Correcting a Mask Design Layout Application Type: Continuation Patent Number: 7614032 Country: United States Status: Filed on 11-Dec-2006, Issued on 3-Nov-2009, Patent ...
URL: https://www.src.org/library/patent/p1016/
Modified: 2009-11-03 - 23KB
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- 21:
Method for Correcting a Mask Design Layout (Patent P0386) - SRC
- Method for Correcting a Mask Design Layout Application Type: Utility Patent Number: 7149999 Country: United States Status: Filed on 25-Feb-2004, Issued on 12-Dec-2006, Patent ...
URL: https://www.src.org/library/patent/p0386/
Modified: 2006-12-12 - 23KB
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- 22:
Method and Apparatus to Reduce Noise Fluctuation in On-Chip Power...
- Method and Apparatus to Reduce Noise Fluctuation in On-Chip Power Distribution Networks Application Type: Utility Patent Number: 7595679 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0564/
Modified: 2009-09-29 - 22KB
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- 23:
Method and System to Check Correspondence between Different Representa...
- Method and System to Check Correspondence between Different Representations of a Circuit Application Type: Continuation (in part) Patent Number: 7418680 Country: United States ...
URL: https://www.src.org/library/patent/p0476/
Modified: 2008-08-26 - 22KB
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- 24:
Method and System for Synthesizing Relative Timing Constraints...
- Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification Application Type: Continuation Patent Number: ...
URL: https://www.src.org/library/patent/p1354/
Modified: 2012-11-27 - 24KB
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- 25:
Systems, Methods and Computer Program Products for Creating Hierarchic...
- Systems, Methods and Computer Program Products for Creating Hierarchical Equivalent Circuit Models Application Type: Utility Patent Number: 7096174 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0200/
Modified: 2006-08-22 - 24KB
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- 26:
System and Method for Testing a Logic-Based Processing Device...
- System and Method for Testing a Logic-Based Processing Device Application Type: Utility Patent Number: 9928150 Country: United States Status: Filed on 30-Jun-2014, Issued on ...
URL: https://www.src.org/library/patent/p1458/
Modified: 2018-03-27 - 22KB
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- 27:
System and Method to Test Integrated Circuits on a Wafer (Patent...
- System and Method to Test Integrated Circuits on a Wafer Application Type: Utility Patent Number: 7325180 Country: United States Status: Filed on 26-Nov-2003, Issued on ...
URL: https://www.src.org/library/patent/p0413/
Modified: 2008-01-29 - 22KB
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- 28:
METHOD FOR CORRECTING A MASK DESIGN LAYOUT (Patent P1708) - SRC
- METHOD FOR CORRECTING A MASK DESIGN LAYOUT Application Type: Utility Patent Number: 7149999 Country: United States Status: Filed on 25-Feb-2004, Issued on 12-Dec-2006, Patent ...
URL: https://www.src.org/library/patent/p1708/
Modified: 2006-12-12 - 23KB
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- 29:
3D IC University Research e-Workshop (Event E004357) - SRC
- 3D IC University Research e-Workshop Date: Thursday, May 5, 2011, noon-4:30 p.m. ET Location: SRC Conference Room D; via web conference, Research Triangle Park, NC, United States ...
URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB
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- 30:
TECHCON 2010 Preview - SRC
- TECHCON 2010 Preview TECHCON is the primary event where SRC presents the best of research sponsored by the membership and showcases the students who perform the research. It is ...
URL: https://www.src.org/calendar/e003428/preview/
Modified: 2010-07-28 - 24KB
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