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[x] GRC Science Area
CADTS – Computer Aided Design & Test Sciences

Content Type
Patent Filings 12
Events 11
Other 1

SRC Program
GRC 18
SRC 6
3D EC 1
FCRP 1

Year
2013 1
2012 1
2011 6
2010 3

Center
C2S2 2
EBSM 2
FENA 2
GSRC 2
IFC 2
MSD 2
MuSyC 2
TxACE 2
ACE4S 1
C-FAR 1
CAIST 1
CDADIC 1
CEMPI 1
CHIRP 1
CNFD 1
FAME 1
INDEX 1
IPC 1
LEAST 1
NCRC 1
NPT 1
SONIC 1
SWAN 1
TerraSwarm 1

Thrust/Theme
DesTech – Design Techniques 4
TT – Test & Testability 4
CADT – Computer-Aided Design and... 3
TechCAD – Technology CAD 3
VER – Verification 3
DV – Design Verification 2
ADS – Alternative Device Structu... 1
AIHW – Artificial Intelligence H... 1
AMS – Analog and Mixed-Signal De... 1
AMS-CSD – Analog/Mixed-Signal Ci... 1
AdvTech – Advanced Technology 1
Advanced Bipolar SOI-MOS Transis... 1
Advanced Devices 1
Advanced Devices & Technologies 1
Advanced Technology Option 1
Analysis Design & Simulation 1
BEP – Back End Processes 1
Back End Processes 1
C&S – Controls and Sensing 1
CD – Circuit Design 1
CFM&TCM – CFM & Total Chemical M... 1
CM – Compact Modeling 1
CSR – Cross-Disciplinary Semicon... 1
Contamination Control 1
Cost Reduction 1
DCMOS – Digital CMOS Technologie... 1
DE – Design Environment 1
DSMS – Device Sciences Modeling ... 1
Defect Reduction 1
Deposition 1
DesSyn – Design Synthesis 1
Doping Technologies 1
EP3C – Efficiency and Performanc... 1
ESH – Environment Safety and Hea... 1
Equip Automation & Process Contr... 1
Equip – Equipment 1
Equip. Auto. and Process Control 1
FACSYS – Factory Systems 1
FAM – Factory Automation & Manag... 1
FEOL – FEOL Processes 1
FacOps – Factory Operations 1
Factory Systems 1
Front End Processes 1
HWS – Hardware Security 1
Heat Signal & Power Distribution 1
Heat Signal Power 1
I3T – Innovative and Intelligent... 1
ISD – Integrated System Design 1
Interconnect Architecture 1
LMD – Logic and Memory Devices 1
LPD – Logic & Physical Design 1
Lithography 1
Logic Design 1
Logistics & Modeling/Simulation 1
MT – Memory Technologies 1
MTMP – Metrology Tools Matls & P... 1
Masks 1
Materials 1
Materials & Measurements 1
Metrology 1
Modeling & Simulation 1
Modeling & TCAD 1
Multi-level Interconnect 1
NCR – Non-Classical CMOS Researc... 1
NEM – Nanoengineered Materials 1
NMP – Nanomanufacturing Material... 1
PAT – Patterning 1
PKG – Packaging 1
PMM – Packaging Materials and Me... 1
PMS – Packaging Modeling and Sim... 1
PS/E – Process Simplification/En... 1
Package & Electrical Design 1
Package Reliability 1
Packaging & Interconnect Systems 1
Packaging Materials Interfaces 1
Pat(MPS) – Patterning 1
PatMat – Patterning Materials 1
PatSys – Patterning Systems 1
PhyDes – Physical Design 1
Physical Design 1
Plasma Etch 1
Process Architecture 1
Processes – Processes 1
Quality & Reliability 1
Rapid Yield Learning 1
Reliability 1
Resist 1
SLD – System Level Design 1
SemiSynBio – Semiconductor Synth... 1
Semiconductor Modeling & Simulat... 1
Signal/Power Management 1
Substrates 1
Synthesis & Verification 1
TCAD-MBPS 1
TM – Thermal Management 1

1 through 24 of 24 similar documents, best matches first.   
1: pdfFinal Report - Workshop on Failure and Uncertainty in Mixed-Signal...
National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB
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2: TECHCON 2013 (Event E004683) - SRC
TECHCON 2013 Date: Monday, Sept. 9, 2013, 8 a.m. - Tuesday, Sept. 10, 2013, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004683 E004683 image ...
URL: https://www.src.org/calendar/e004683/
Modified: 2014-03-10 - 136KB
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3: pdfSRC/NSF Design Forum - Position Statement
A Position Statement in the Forum on Future Directions for Design Automation Research Jason Cong UCLA Computer Science Department http://cadlab.cs.ucla.edu/~cong There are many ...
URL: https://www.src.org/...764/jason-cong-position-statement.pdf
Modified: 2011-08-02 - 35KB
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4: TECHCON 2012 (Event E004114) - SRC
TECHCON 2012 Date: Monday, Sept. 10, 2012, 8 a.m. - Tuesday, Sept. 11, 2012, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004114 E004114 ...
URL: https://www.src.org/calendar/e004114/
Modified: 2013-03-11 - 98KB
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5: pdfDesign Forum: Sharad Malik Panel Position Statement
Making our Way through the End-of-the Roadmap Maze Panel Position Statement Sharad Malik Princeton University As we look forward over the next 10-15 years, there are several ...
URL: https://www.src.org/...4/sharad-malik-position-statement.pdf
Modified: 2011-08-02 - 20KB
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6: pdfE003932 - Variability Forum - Spanos
1 University of California . Berkeley . EECS . C. J. Spanos . 4/30/2010 Statistical Description of Process Variability First International Variability Characterization Workshop ...
URL: https://www.src.org/calendar/e003932/e003932_s2_1_spanos.pdf
Modified: 2010-06-29 - 2.8MB
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7: System and Method for Testing a Logic-Based Processing Device...
System and Method for Testing a Logic-Based Processing Device Application Type: Utility Patent Number: 9928150 Country: United States Status: Filed on 30-Jun-2014, Issued on ...
URL: https://www.src.org/library/patent/p1458/
Modified: 2018-03-27 - 22KB
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8: Software-Based Self-Test and Diagnosis Using on-Chip Memory ...
Software-Based Self-Test and Diagnosis Using on-Chip Memory Application Type: Divisional Patent Number: 10788532 Country: United States Status: Filed on 30-Nov-2017, Issued on ...
URL: https://www.src.org/library/patent/p1753/
Modified: 2020-09-29 - 26KB
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9: Software-Based Self-Test and Diagnosis Using on-Chip Memory ...
Software-Based Self-Test and Diagnosis Using on-Chip Memory Application Type: Divisional Patent Number: 10845416 Country: United States Status: Filed on 30-Nov-2017, Issued on ...
URL: https://www.src.org/library/patent/p1752/
Modified: 2020-11-24 - 26KB
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10: Integrated Logic Circuit Including Impedance Fault Detection...
Integrated Logic Circuit Including Impedance Fault Detection Application Type: Utility Patent Number: 5383194 Country: United States Status: Filed on 6-Nov-1992, Issued on ...
URL: https://www.src.org/library/patent/p0066/
Modified: 1995-01-17 - 21KB
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11: Software-Based Self-Test and Diagnosis Using On-Chip Memory ...
Software-Based Self-Test and Diagnosis Using On-Chip Memory Application Type: Utility Patent Number: 9864007 Country: United States Status: Filed on 30-Apr-2014, Issued on ...
URL: https://www.src.org/library/patent/p1457/
Modified: 2018-01-09 - 25KB
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12: Apparatus for Detecting Bugs in Logic-Based Processing Devices...
Apparatus for Detecting Bugs in Logic-Based Processing Devices Application Type: Utility Patent Number: 10120737 Country: United States Status: Filed on 18-Feb-2016, Issued on ...
URL: https://www.src.org/library/patent/p1597/
Modified: 2018-11-06 - 23KB
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13: Method of Fabricating a Self-Aligned High Speed MOSFET Device...
Method of Fabricating a Self-Aligned High Speed MOSFET Device Application Type: Continuation (in part) Patent Number: 5599728 Country: United States Status: Filed on 28-Oct-1994, ...
URL: https://www.src.org/library/patent/p0006/
Modified: 1997-02-04 - 22KB
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14: Dynamic Threshold Voltage Mosfet Having Gate to Body Connection...
Dynamic Threshold Voltage Mosfet Having Gate to Body Connection for Ultra-Low Voltage Operation Application Type: Utility Patent Number: 5559368 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0004/
Modified: 1996-09-24 - 22KB
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15: ESD/EOS Protection Circuits for Integrated Circuits (Patent P0074...
ESD/EOS Protection Circuits for Integrated Circuits Application Type: Utility Patent Number: 5450267 Country: United States Status: Filed on 31-Mar-1993, Issued on 12-Sep-1995, ...
URL: https://www.src.org/library/patent/p0074/
Modified: 1995-09-12 - 25KB
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16: Method, Apparatus and Computer Program Product for Determining...
Method, Apparatus and Computer Program Product for Determining a Frequency Domain Response of a Nonlinear Microelectronic Circuit Application Type: Utility Patent Number: 5663890 ...
URL: https://www.src.org/library/patent/p0014/
Modified: 1997-09-02 - 24KB
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17: Source Contact Placement for Efficient ESD/EOS Protection in...
Source Contact Placement for Efficient ESD/EOS Protection in Grounded Substrate MOS Integrated Circuit Application Type: Utility Patent Number: 5404041 Country: United States ...
URL: https://www.src.org/library/patent/p0067/
Modified: 1995-04-04 - 25KB
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18: Methods, Apparatus and Computer Program products for Synthesizing...
Methods, Apparatus and Computer Program products for Synthesizing Integrated Circuits with Electrostatic Discharge Capability and Correcting Ground Rule Faults Therein Application ...
URL: https://www.src.org/library/patent/p0049/
Modified: 1998-08-18 - 27KB
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19: Semiconductor Research Corporation - SRC
GRC GRC Global Research Collaboration Our motivation is to fund the most relevant and critical research for international companies, so we go where the best university talent ...
URL: https://www.src.org/program/grc/
Modified: 2023-10-10 - 33KB
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20: pdfDesign Forum: David Kung Position Statement
Future of Design Automation To determine the future direction of Design Automation, we need to take a careful look at the trends in design (systems and circuits) and technology. On ...
URL: https://www.src.org/...764/david-kung-position-statement.pdf
Modified: 2011-08-02 - 33KB
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21: pdfPresentation Title
PAGE 1 QUALCOMM CONFIDENTIAL AND PROPRIETARY QUALCOMM CONFIDENTIAL AND PROPRIETARY qctconnect.com 3D Through Si Stacking Technology - an IFM Perspective - RikoR May 11 PAGE 2 ...
URL: https://www.src.org/calendar/e004357/02-radojcic.pdf
Modified: 2011-05-04 - 2.4MB
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22: TECHCON 2011 (Event E004113) - SRC
TECHCON 2011 Date: Monday, Sept. 12, 2011, 8 a.m. - Tuesday, Sept. 13, 2011, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004113 E004113 ...
URL: https://www.src.org/calendar/e004113/
Modified: 2012-03-13 - 97KB
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23: pdfE003932 - Variability Forum - Gupta
NanoCAD Lab Modeling Performance Impact of Variability Puneet Gupta Dept. of EE, University of California Los Angeles (puneet@ee.ucla.edu) Work partly supported by NSF, UC ...
URL: https://www.src.org/calendar/e003932/e003932_s2_2_gupta.pdf
Modified: 2010-06-29 - 1.4MB
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24: pdfE003932 - Variability Forum - Chuang_Su
C. T. Chuang and P. Su, 04/2010 Variability and Design of SRAM in Scaled and Emerging Technologies Ching-Te Chuang and Pin Su Department of Electronics Engineering and Institute of ...
URL: https://www.src.org/...ar/e003932/e003932_s3_1_chuang_su.pdf
Modified: 2010-06-29 - 1.8MB
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1 through 24 of 24 similar documents, best matches first.