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GRC Science Area
ICSS – Integrated Circuit & Systems Sciences
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1 through 10 of
10 similar documents, best matches first. |
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- 1:
Static Random Access Memory Cell and Devices using Same (Patent...
- Static Random Access Memory Cell and Devices using Same Application Type: Utility Patent Number: 7952912 Country: United States Status: Filed on 6-Jun-2008, Issued on 31-May-2011, ...
URL: https://www.src.org/library/patent/p1083/
Modified: 2011-05-31 - 22KB Find Similar Documents
- 2:
Method and Circuit for Reducing Leakage and Increasing Read Stability...
- Method and Circuit for Reducing Leakage and Increasing Read Stability in a Memory Device Application Type: Utility Patent Number: 7328413 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0486/
Modified: 2008-02-05 - 22KB Find Similar Documents
- 3:
TECHCON 2012 (Event E004114) - SRC
- TECHCON 2012 Date: Monday, Sept. 10, 2012, 8 a.m. - Tuesday, Sept. 11, 2012, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004114 E004114 ...
URL: https://www.src.org/calendar/e004114/
Modified: 2013-03-11 - 98KB Find Similar Documents
- 4:
Self-Repairing Technique in Nano-scale SRAM to Reduce Parametric...
- Self-Repairing Technique in Nano-scale SRAM to Reduce Parametric Failures Application Type: Utility Patent Number: 7508697 Country: United States Status: Filed on 9-May-2007, ...
URL: https://www.src.org/library/patent/p1008/
Modified: 2009-03-24 - 23KB Find Similar Documents
- 5:
Sense Amplifier Circuit (Patent P0606) - SRC
- Sense Amplifier Circuit Application Type: Utility Patent Number: 7304903 Country: United States Status: Filed on 23-Jan-2006, Issued on 4-Dec-2007, Patent Abandoned Organization: ...
URL: https://www.src.org/library/patent/p0606/
Modified: 2007-12-04 - 22KB Find Similar Documents
- 6:
Low Power Scan Design and Delay Fault Testing Technique Using...
- Low Power Scan Design and Delay Fault Testing Technique Using First Level Supply Gating Application Type: Utility Patent Number: 7319343 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0516/
Modified: 2008-01-15 - 22KB Find Similar Documents
- 7:
TECHCON 2011 (Event E004113) - SRC
- TECHCON 2011 Date: Monday, Sept. 12, 2011, 8 a.m. - Tuesday, Sept. 13, 2011, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004113 E004113 ...
URL: https://www.src.org/calendar/e004113/
Modified: 2012-03-13 - 97KB Find Similar Documents
- 8:
Semiconductor Research Corporation - SRC
- GRC GRC Global Research Collaboration Our motivation is to fund the most relevant and critical research for international companies, so we go where the best university talent ...
URL: https://www.src.org/program/grc/
Modified: 2023-10-10 - 33KB Find Similar Documents
- 9:
Slide 1
- Third Annual India Design Review January 7-8, 2015 William H. Joyner, Jr. CADTS William.Joyner@src.org David C. Yeh ICSS David.Yeh@src.org Restricted Distribution: Contains SRC ...
URL: https://www.src.org/...r/e005563/2015_indiawelcome_final.pdf
Modified: 2015-02-04 - 319KB Find Similar Documents
- 10:
Final Report - Workshop on Failure and Uncertainty in Mixed-Signal...
- National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB Find Similar Documents
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10 similar documents, best matches first. |
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