[x]
Content Type
Patent Filings
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Thrust/Theme
CADT – Computer-Aided Design and Test
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| 1 through 8 of
8 similar documents, best matches first. |
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- 1:
Testing Monolithic Three Dimensional Integrated Circuits (Patent...
- Testing Monolithic Three Dimensional Integrated Circuits Application Type: Utility Patent Number: 10775429 Country: United States Status: Filed on 2-Nov-2017, Issued on 15-Sep-2020 ...
URL: https://www.src.org/library/patent/p1746/
Modified: 2020-09-15 - 25KB
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- 2:
Evaluating Functional Fault Criticality of Structural Faults...
- Evaluating Functional Fault Criticality of Structural Faults for Circuit Testing Application Type: Utility Patent Number: 12008298 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1929/
Modified: 2024-06-11 - 29KB
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- 3:
Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
- Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Continuation (in part) Patent Number: 10838003 Country: United States ...
URL: https://www.src.org/library/patent/p1826/
Modified: 2020-11-17 - 25KB
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- 4:
Multi-Layer Integrated Circuits Having Isolation Cells for Layer...
- Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Utility Patent Number: 10338133 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p1639/
Modified: 2019-07-02 - 25KB
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- 5:
System and Method for Testing a Logic-Based Processing Device...
- System and Method for Testing a Logic-Based Processing Device Application Type: Utility Patent Number: 9928150 Country: United States Status: Filed on 30-Jun-2014, Issued on ...
URL: https://www.src.org/library/patent/p1458/
Modified: 2018-03-27 - 22KB
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- 6:
Automated Synthesis of Virtual System-on-Chip Environments (Patent...
- Automated Synthesis of Virtual System-on-Chip Environments Application Type: Utility Country: United States Status: Filed on 16-Feb-2023, Published by Patent Office Organization: ...
URL: https://www.src.org/library/patent/p2048/
Modified: 2023-02-16 - 23KB
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- 7:
Fault Criticality Assessment using Graph Convolutional Networks...
- Fault Criticality Assessment using Graph Convolutional Networks Application Type: Utility Country: United States Status: Filed on 29-Jan-2021, Published by Patent Office ...
URL: https://www.src.org/library/patent/p1956/
Modified: 2021-01-29 - 22KB
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- 8:
Cost Effective DAC Linearization System (Patent P1749) - SRC
- Cost Effective DAC Linearization System Application Type: Utility Patent Number: 10218371 Country: United States Status: Filed on 1-Mar-2018, Issued on 26-Feb-2019 Organization: ...
URL: https://www.src.org/library/patent/p1749/
Modified: 2019-02-26 - 28KB
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8 similar documents, best matches first. |
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