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GRC

Content Type
Patent Filings 453
Events 102
Other 84

Year
2024 2
2023 9
2022 10
2021 8
2020 6
2019 8
2018 14
2017 5
2016 7
2015 8
2014 3
2013 4
2012 8
2011 59
2010 32
2009 1
2008 1

Center
TxACE 39
ACE4S 22
EBSM 16
CHIRP 7
CEMPI 4
CAIST 3
C2S2 2
FENA 2
GSRC 2
NCRC 2
C-SPIN 1
CDADIC 1
CNFD 1
CRISP 1
IPC 1
NRI-NSF 1

Thrust/Theme
CD – Circuit Design 62
PAT – Patterning 47
TT – Test & Testability 38
AMS-CSD – Analog/Mixed-Signal Ci... 27
Advanced Devices & Technologies 27
HWS – Hardware Security 26
SLD – System Level Design 26
I3T – Innovative and Intelligent... 24
ISD – Integrated System Design 24
LPD – Logic & Physical Design 22
PKG – Packaging 22
CADT – Computer-Aided Design and... 20
NMP – Nanomanufacturing Material... 20
NEM – Nanoengineered Materials 19
Factory Systems 18
ESH – Environment Safety and Hea... 16
Pat(MPS) – Patterning 16
BEP – Back End Processes 14
ADS – Alternative Device Structu... 9
DCMOS – Digital CMOS Technologie... 9
Back End Processes 8
VER – Verification 8
DesTech – Design Techniques 7
Doping Technologies 7
LMD – Logic and Memory Devices 7
MT – Memory Technologies 7
PatMat – Patterning Materials 7
CFM&TCM – CFM & Total Chemical M... 6
Packaging & Interconnect Systems 5
Physical Design 5
AIHW – Artificial Intelligence H... 4
FACSYS – Factory Systems 4
MTMP – Metrology Tools Matls & P... 4
Masks 4
Materials 4
Modeling & Simulation 4
SemiSynBio – Semiconductor Synth... 4
TechCAD – Technology CAD 4
DesSyn – Design Synthesis 3
Processes – Processes 3
AMS – Analog and Mixed-Signal De... 2
AdvTech – Advanced Technology 2
C&S – Controls and Sensing 2
CM – Compact Modeling 2
DV – Design Verification 2
EP3C – Efficiency and Performanc... 2
Front End Processes 2
Metrology 2
Multi-level Interconnect 2
Reliability 2
Synthesis & Verification 2
Advanced Bipolar SOI-MOS Transis... 1
Advanced Devices 1
Advanced Technology Option 1
Analysis Design & Simulation 1
CRISP-T1 – Hardware Support for ... 1
CSR – Cross-Disciplinary Semicon... 1
Contamination Control 1
Cost Reduction 1
DE – Design Environment 1
DSMS – Device Sciences Modeling ... 1
Defect Reduction 1
Deposition 1
Equip Automation & Process Contr... 1
Equip – Equipment 1
Equip. Auto. and Process Control 1
FAM – Factory Automation & Manag... 1
FEOL – FEOL Processes 1
FacOps – Factory Operations 1
Heat Signal & Power Distribution 1
Heat Signal Power 1
Interconnect Architecture 1
Lithography 1
Logic Design 1
Logistics & Modeling/Simulation 1
Materials & Measurements 1
Modeling & TCAD 1
NCR – Non-Classical CMOS Researc... 1
PMM – Packaging Materials and Me... 1
PMS – Packaging Modeling and Sim... 1
PS/E – Process Simplification/En... 1
Package & Electrical Design 1
Package Reliability 1
Packaging Materials Interfaces 1
PatSys – Patterning Systems 1
PhyDes – Physical Design 1
Plasma Etch 1
Process Architecture 1
Quality & Reliability 1
Rapid Yield Learning 1
Resist 1
Semiconductor Modeling & Simulat... 1
Signal/Power Management 1
Substrates 1
TCAD-MBPS 1
TM – Thermal Management 1

GRC Science Area
ICSS – Integrated Circuit & Syst... 95
NMS – Nanomanufacturing Sciences 94
MPS – Material & Process Science... 89
CADTS – Computer Aided Design & ... 80
NIS – Nanostructure & Integratio... 54
LIT – Lithography Sciences 42
IPS – Interconnect & Packaging S... 38
DES – Design Sciences 30
MIC – Microstructure Sciences 29
PID – Process Integration & Devi... 29
DS – Device Sciences 28
MBP – Materials & Bulk Processes... 23
INT – Interconnect Sciences 12
ES-H – Environmental Safety & He... 9
MFGPS – Manufacturing Process Sc... 4
PKG – Packaging Sciences 4
CSR – Cross-disciplinary Semicon... 2
FAC – Factory Sciences 2
GEN – General 1
ISA – Industrial Support Activit... 1
MFG – Manufacturing Sciences 1
MSS – Manufacturing Systems Scie... 1
SMS – Semiconductor Modeling & S... 1
SRCEA – SRC Education Alliance 1
TT – Technology Transfer 1

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1: India Design Review (Event E005563) - SRC
India Design Review Date: Wednesday, Jan. 7, 2015, 6 p.m. - Thursday, Jan. 8, 2015, 5 p.m. Local Location: Hyatt Bangalore, 1/1, Swami Vivekananda Road, Off M.G. Road, Ulsoor, ...
URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB
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2: GRC SEMATECH Engineering Research Center for Environmentally...
GRC SEMATECH Engineering Research Center for Environmentally Benign Semiconductor Manufacturing Site Review Date: Wednesday, March 9, 2011, 8 a.m. - Friday, March 11, 2011, 5 p.m. ...
URL: https://www.src.org/calendar/e003989/
Modified: 2011-09-11 - 73KB
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3: 2008 GRC compelling research reasons - SRC
2008 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 1292 Interconnect & Packaging Sciences The New ...
URL: https://www.src.org/...ive/2008/compelling-research-reasons/
Modified: 2010-06-26 - 188KB
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4: GRC SEMATECH Engineering Research Center for Environmentally...
GRC SEMATECH Engineering Research Center for Environmentally Benign Semiconductor Manufacturing Review Date: Tuesday, March 20, 2012, 4 p.m. - Thursday, March 22, 2012, 2 p.m. MT ...
URL: https://www.src.org/calendar/e004390/
Modified: 2012-09-22 - 78KB
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5: 2007 GRC compelling research reasons - SRC
2007 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 1241 Computer Aided Design & Test Sciences A ...
URL: https://www.src.org/...ive/2007/compelling-research-reasons/
Modified: 2010-06-26 - 167KB
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6: 2006 GRC compelling research reasons - SRC
2006 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 1190 Integrated Circuit & Systems Sciences ...
URL: https://www.src.org/...ive/2006/compelling-research-reasons/
Modified: 2010-06-26 - 200KB
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7: Quantifier Elimination by Dependency Sequents (Patent P1309)...
Quantifier Elimination by Dependency Sequents Application Type: Utility Patent Number: 8438513 Country: United States Status: Filed on 30-Dec-2011, Issued on 7-May-2013, Patent ...
URL: https://www.src.org/library/patent/p1309/
Modified: 2013-05-07 - 22KB
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8: Cost Effective DAC Linearization System (Patent P1749) - SRC
Cost Effective DAC Linearization System Application Type: Utility Patent Number: 10218371 Country: United States Status: Filed on 1-Mar-2018, Issued on 26-Feb-2019 Organization: ...
URL: https://www.src.org/library/patent/p1749/
Modified: 2019-02-26 - 28KB
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9: Method and Apparatus for Analysing and Modeling of Analog Systems...
Method and Apparatus for Analysing and Modeling of Analog Systems Application Type: European Patent Office Patent Number: 02761590.5 Status: Issued on 19-Feb-2011, Patent Expired ...
URL: https://www.src.org/library/patent/p0465/
Modified: 2011-02-19 - 22KB
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10: Methods and Related Systems of Ultra-Short Pulse Detection (Patent...
Methods and Related Systems of Ultra-Short Pulse Detection Application Type: Utility Patent Number: 10191454 Country: United States Status: Filed on 13-Jun-2017, Issued on ...
URL: https://www.src.org/library/patent/p1681/
Modified: 2019-01-29 - 23KB
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11: Method and System for Systematic Defect Identification (Patent...
Method and System for Systematic Defect Identification Application Type: Utility Patent Number: 8509517 Country: United States Status: Filed on 29-Dec-2010, Issued on 13-Aug-2013 ...
URL: https://www.src.org/library/patent/p1262/
Modified: 2013-08-13 - 23KB
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12: Asynchronous Finite State Machines (Patent P1610) - SRC
Asynchronous Finite State Machines Application Type: Utility Patent Number: 10310994 Country: United States Status: Filed on 28-Feb-2017, Issued on 4-Jun-2019 Organization: ...
URL: https://www.src.org/library/patent/p1610/
Modified: 2019-06-04 - 22KB
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13: Langmuir Probe System for Radio Frequency Excited Plasma Processing...
Langmuir Probe System for Radio Frequency Excited Plasma Processing System Application Type: Utility Patent Number: 5339039 Country: United States Status: Filed on 29-Sep-1992, ...
URL: https://www.src.org/library/patent/p0130/
Modified: 1994-08-16 - 22KB
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14: Wafer Fabrication Monitoring/Control System and Method (Patent...
Wafer Fabrication Monitoring/Control System and Method Application Type: Utility Patent Number: 9366601 Country: United States Status: Filed on 15-Mar-2012, Issued on 14-Jun-2016 ...
URL: https://www.src.org/library/patent/p1332/
Modified: 2016-06-14 - 23KB
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15: Automated Synthesis of Virtual System-on-Chip Environments (Patent...
Automated Synthesis of Virtual System-on-Chip Environments Application Type: Utility Country: United States Status: Filed on 16-Feb-2023, Published by Patent Office Organization: ...
URL: https://www.src.org/library/patent/p2048/
Modified: 2023-02-16 - 23KB
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16: Reconfigurable System-on-Chip Security Architecture (Patent P1739...
Reconfigurable System-on-Chip Security Architecture Application Type: Utility Patent Number: 10521600 Country: United States Status: Filed on 13-Dec-2017, Issued on 31-Dec-2019 ...
URL: https://www.src.org/library/patent/p1739/
Modified: 2019-12-31 - 22KB
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17: Systems, Methods and Computer Program Products for Creating Hierarchic...
Systems, Methods and Computer Program Products for Creating Hierarchical Equivalent Circuit Models Application Type: Utility Patent Number: 7096174 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0200/
Modified: 2006-08-22 - 24KB
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18: Method and Apparatus for Sampling and Predicting Rare Events...
Method and Apparatus for Sampling and Predicting Rare Events in Complex Electronic Devices, Circuits and Systems Application Type: Utility Patent Number: 8155938 Country: United ...
URL: https://www.src.org/library/patent/p1078/
Modified: 2012-04-10 - 24KB
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19: Self-Repairing Technique in Nano-scale SRAM to Reduce Parametric...
Self-Repairing Technique in Nano-scale SRAM to Reduce Parametric Failures Application Type: Utility Patent Number: 7508697 Country: United States Status: Filed on 9-May-2007, ...
URL: https://www.src.org/library/patent/p1008/
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20: System and Method Converting the Polarization State of an Optical...
System and Method Converting the Polarization State of an Optical Beam into an Inhomogenously Polarized State Application Type: Utility Patent Number: 7414786 Country: United ...
URL: https://www.src.org/library/patent/p0496/
Modified: 2008-08-19 - 24KB
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21: Clock Gating with an Asynchronous Wrapper Cell (Patent P1440...
Clock Gating with an Asynchronous Wrapper Cell Application Type: Utility Patent Number: 9753486 Country: United States Status: Filed on 15-Jun-2015, Issued on 5-Sep-2017 ...
URL: https://www.src.org/library/patent/p1440/
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22: Formal Verification of a Logic Design Through Implicit Enumeration...
Formal Verification of a Logic Design Through Implicit Enumeration of Strongly Connected Components Application Type: Utility Patent Number: 6526551 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0189/
Modified: 2003-02-25 - 22KB
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23: Enhanced Stripping of Implanted Resists (Patent P1259) - SRC
Enhanced Stripping of Implanted Resists Application Type: Utility Patent Number: 8772170 Country: United States Status: Filed on 29-Dec-2010, Issued on 8-Jul-2014, Patent Abandoned ...
URL: https://www.src.org/library/patent/p1259/
Modified: 2014-07-08 - 25KB
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24: Method and Apparatus For Rapidly Modeling and Simulating Intra...
Method and Apparatus For Rapidly Modeling and Simulating Intra-Die Statistical Variations in Integrated Circuits using Compressed Parameter Models Application Type: Utility Patent ...
URL: https://www.src.org/library/patent/p1160/
Modified: 2012-10-16 - 24KB
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25: Methods of Operating on Data in a Fully Homomorphic Encryption...
Methods of Operating on Data in a Fully Homomorphic Encryption System Using In-Situ Processing-in-Memory and Related Circuits Application Type: Utility Country: United States ...
URL: https://www.src.org/library/patent/p2112/
Modified: 2023-01-10 - 25KB
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26: Time-Based Decision Feedback Equalization (Patent P1719) - SRC
Time-Based Decision Feedback Equalization Application Type: Utility Patent Number: 10284395 Country: United States Status: Filed on 8-Nov-2017, Issued on 7-May-2019 Organization: ...
URL: https://www.src.org/library/patent/p1719/
Modified: 2019-05-07 - 23KB
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27: Method and System to Check Correspondence between Different Representa...
Method and System to Check Correspondence between Different Representations of a Circuit Application Type: Continuation (in part) Patent Number: 7418680 Country: United States ...
URL: https://www.src.org/library/patent/p0476/
Modified: 2008-08-26 - 22KB
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28: Method and System for Synthesizing Relative Timing Constraints...
Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification Application Type: Continuation Patent Number: ...
URL: https://www.src.org/library/patent/p1354/
Modified: 2012-11-27 - 24KB
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29: Method and System for Synthesizing Relative Timing Constraints...
Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification Application Type: Utility Patent Number: 8239796 ...
URL: https://www.src.org/library/patent/p1202/
Modified: 2012-08-07 - 24KB
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30: System and Method to Test Integrated Circuits on a Wafer (Patent...
System and Method to Test Integrated Circuits on a Wafer Application Type: Utility Patent Number: 7325180 Country: United States Status: Filed on 26-Nov-2003, Issued on ...
URL: https://www.src.org/library/patent/p0413/
Modified: 2008-01-29 - 22KB
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1 through 30 of 639 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 4 5 6 7 8 9 10 next >>