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261 similar documents, best matches first. |
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- 1:
Time-Based Decision Feedback Equalization (Patent P1719) - SRC
- Time-Based Decision Feedback Equalization Application Type: Utility Patent Number: 10284395 Country: United States Status: Filed on 8-Nov-2017, Issued on 7-May-2019 Organization: ...
URL: https://www.src.org/library/patent/p1719/
Modified: 2019-05-07 - 23KB Find Similar Documents
- 2:
2010 SRC Operations Plan
- 2010 SRC Operations Plan Restricted Distribution: Contains SRC Confidential Material Final - March 2010 2 Table of Contents 2010 SRC Operations Plan Section I Introduction ...
URL: https://www.src.org/...board/executive/etab2010ops-final.pdf
Modified: 2010-07-01 - 541KB Find Similar Documents
- 3:
2006 GRC compelling research reasons - SRC
- 2006 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 1190 Integrated Circuit & Systems Sciences ...
URL: https://www.src.org/...ive/2006/compelling-research-reasons/
Modified: 2010-06-26 - 200KB Find Similar Documents
- 4:
IRP Advisory Board Meeting
- AMS-CSD Research Program Annual Review Oct 17-20, 2023 UT Dallas, TX Marcus Pan, Science Director LaTanya Holmes, Research Program Coordinator https://www.src.org/calendar/e007770/ ...
URL: https://www.src.org/calendar/e007770/2023_ams-csd_intro.pdf
Modified: 2023-10-25 - 594KB Find Similar Documents
- 5:
Testing an Analog-to-Digital Converter Using Counters (Patent...
- Testing an Analog-to-Digital Converter Using Counters Application Type: Utility Patent Number: 10951221 Country: United States Status: Filed on 7-Jan-2020, Issued on 16-Mar-2021 ...
URL: https://www.src.org/library/patent/p1821/
Modified: 2021-03-16 - 23KB Find Similar Documents
- 6:
A Data Remanence Based Approach to Extract a Stable Secret Key...
- A Data Remanence Based Approach to Extract a Stable Secret Key from an SRAM Memory Application Type: Utility Patent Number: 11309018 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p1738/
Modified: 2022-04-19 - 23KB Find Similar Documents
- 7:
Stable Memory Cell Identification for Hardware Security (Patent...
- Stable Memory Cell Identification for Hardware Security Application Type: Divisional Patent Number: 11769548 Country: United States Status: Filed on 10-Mar-2022, Issued on ...
URL: https://www.src.org/library/patent/p2034/
Modified: 2023-09-26 - 23KB Find Similar Documents
- 8:
Dynamic Functional Obfuscation (Patent P1727) - SRC
- Dynamic Functional Obfuscation Application Type: Utility Patent Number: 11061997 Country: United States Status: Filed on 3-Aug-2017, Issued on 13-Jul-2021 Organization: University ...
URL: https://www.src.org/library/patent/p1727/
Modified: 2021-07-13 - 27KB Find Similar Documents
- 9:
2005 GRC Compelling Research Report - SRC
- 2005 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 658 Nanostructure & Integration Sciences Role ...
URL: https://www.src.org/...ive/2005/compelling-research-reasons/
Modified: 2010-06-26 - 189KB Find Similar Documents
- 10:
2007 GRC compelling research reasons - SRC
- 2007 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 1241 Computer Aided Design & Test Sciences A ...
URL: https://www.src.org/...ive/2007/compelling-research-reasons/
Modified: 2010-06-26 - 167KB Find Similar Documents
- 11:
Robust Device Authentication (Patent P1612) - SRC
- Robust Device Authentication Application Type: Utility Patent Number: 10235517 Country: United States Status: Filed on 13-May-2016, Issued on 19-Mar-2019 Organization: University ...
URL: https://www.src.org/library/patent/p1612/
Modified: 2019-03-19 - 22KB Find Similar Documents
- 12:
India Design Review (Event E005563) - SRC
- India Design Review Date: Wednesday, Jan. 7, 2015, 6 p.m. - Thursday, Jan. 8, 2015, 5 p.m. Local Location: Hyatt Bangalore, 1/1, Swami Vivekananda Road, Off M.G. Road, Ulsoor, ...
URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB Find Similar Documents
- 13:
NMS Nanoengineered Materials Review
- NMP Patterning/Front- End Processes Review eBook May 2 & 3, 2018 NC State University Golden LEAF Biomanufacturing Training and Education Center Restricted Distribution: SRC ...
URL: https://www.src.org/calendar/e006394/e006394-ebook.pdf
Modified: 2018-03-30 - 1.6MB Find Similar Documents
- 14:
2008 GRC compelling research reasons - SRC
- 2008 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 1292 Interconnect & Packaging Sciences The New ...
URL: https://www.src.org/...ive/2008/compelling-research-reasons/
Modified: 2010-06-26 - 188KB Find Similar Documents
- 15:
Engineering Research Center for Environmentally Benign Semiconductor...
- Engineering Research Center for Environmentally Benign Semiconductor Manufacturing Review Date: Wednesday, March 20, 2013, 7 a.m. - Thursday, March 21, 2013, 2 p.m. MT Location: ...
URL: https://www.src.org/calendar/e004929/
Modified: 2013-09-21 - 61KB Find Similar Documents
- 16:
Final Report - Workshop on Failure and Uncertainty in Mixed-Signal...
- National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB Find Similar Documents
- 17:
Process for Forming Hafnium Oxide Films (Patent P0235) - SRC
- Process for Forming Hafnium Oxide Films Application Type: Utility Patent Number: 6683011 Country: United States Status: Filed on 14-Nov-2001, Issued on 27-Jan-2004, Patent Expired ...
URL: https://www.src.org/library/patent/p0235/
Modified: 2004-01-27 - 22KB Find Similar Documents
- 18:
Charge-Based Frequency Measurement BIST (Patent P0557) - SRC
- Charge-Based Frequency Measurement BIST Application Type: European Patent Office Patent Number: 1214605 Status: Filed on 19-Jun-2002, Issued on 22-Mar-2006 Organization: University ...
URL: https://www.src.org/library/patent/p0557/
Modified: 2006-03-22 - 23KB Find Similar Documents
- 19:
Charge-Based Frequency Measurement BIST (Patent P0185) - SRC
- Charge-Based Frequency Measurement BIST Application Type: Utility Patent Number: 6885700 Country: United States Status: Filed on 23-Sep-1999, Issued on 26-Apr-2005, Patent ...
URL: https://www.src.org/library/patent/p0185/
Modified: 2005-04-26 - 24KB Find Similar Documents
- 20:
Low Dropout Regulator with Smart Offset (Patent P1809) - SRC
- Low Dropout Regulator with Smart Offset Application Type: Utility Patent Number: 10873257 Country: United States Status: Filed on 6-Sep-2019, Issued on 22-Dec-2020 Organization: ...
URL: https://www.src.org/library/patent/p1809/
Modified: 2020-12-22 - 24KB Find Similar Documents
- 21:
GRC SEMATECH Engineering Research Center for Environmentally...
- GRC SEMATECH Engineering Research Center for Environmentally Benign Semiconductor Manufacturing Review Date: Tuesday, March 20, 2012, 4 p.m. - Thursday, March 22, 2012, 2 p.m. MT ...
URL: https://www.src.org/calendar/e004390/
Modified: 2012-09-22 - 78KB Find Similar Documents
- 22:
Liaison Handbook - SRC
- Liaison Handbook Introduction Initiated in 1983, the Liaison Program is a powerful partnership that brings together university researchers, graduate students and industry experts ...
URL: https://www.src.org/program/grc/guide/liaison-handbook/
Modified: 2010-06-21 - 34KB Find Similar Documents
- 23:
Virtual John Oakley, Science Director Tameka Bell & Mary Nichols...
- Packaging (PKG) e-Kickoff March 23 and 29-31, 2022 Virtual John Oakley, Science Director Tameka Bell & Mary Nichols, Research Program Coordinator SRC Select Disclosure Because the ...
URL: https://www.src.org/calendar/e007527/pkgintroslides.pdf
Modified: 2022-04-04 - 663KB Find Similar Documents
- 24:
Engineering Research Center for Environmentally Benign Semiconductor...
- Engineering Research Center for Environmentally Benign Semiconductor Manufacturing Review Date: Wednesday, March 26, 2014, 7:30 a.m. - Thursday, March 27, 2014, 8 p.m. MT Location: ...
URL: https://www.src.org/calendar/e005160/
Modified: 2014-09-27 - 66KB Find Similar Documents
- 25:
Research Program Annual Review
- Packaging (PKG) Research Program Annual Review July 12-14, 2022 Dallas, TX @ Texas Instruments John Oakley, Science Director Tameka Bell, Research Program Coordinator SRC Select ...
URL: https://www.src.org/...oslides/2022reviewpkgintroduction.pdf
Modified: 2022-07-27 - 514KB Find Similar Documents
- 26:
PowerPoint Presentation
- Logic and Memory Devices Research Program Annual Review Oct 25 - Oct 26, 2022 Samsung Electronics Corporation, San Jose, CA Kashyap Yellai, Science Director Tameka Bell, Research ...
URL: https://www.src.org/...troslides/lmd_2022_ar_introslides.pdf
Modified: 2022-10-28 - 669KB Find Similar Documents
- 27:
2012 - 2016 SRC-GRC Strategic Plan - DRAFT II
- 1 2012-2016 SRC-GRC Strategic Plan Limited Distribution Notice Distribution of the material in this document is limited to employees of SRC-GRC member companies or participating ...
URL: https://www.src.org/...ecutive/2012-2016strat-plan-draft.pdf
Modified: 2011-06-07 - 3.7MB Find Similar Documents
- 28:
2011-2015 SRC-GRC Strategic Plan
- 2011-2015 SRC-GRC Strategic Plan Limited Distribution Notice Distribution of the material in this document is limited to employees of SRC-GRC member companies or participating ...
URL: https://www.src.org/...tab2011-2015-grc-strat-full-draft.pdf
Modified: 2010-07-01 - 1.2MB Find Similar Documents
- 29:
SRC 2003 CADTS Research Needs in test and Testability V4.doc
- Research Challenges in Test and Testability Semiconductor Research Corporation March 2013 Introduction Test and design for testability are recognized today as critical to a ...
URL: https://www.src.org/...rc/cadts/research-needs/2013/test.pdf
Modified: 2013-06-24 - 93KB Find Similar Documents
- 30:
Nanomanufacturing Materials and Processes Annual Review Research...
- Nanomanufacturing Materials and Processes Annual Review Research Program Annual Review Aug 3 - Aug 5, 2022 Tokyo Electron, Austin, TX Kashyap Yellai, Science Director Tameka Bell, ...
URL: https://www.src.org/...56/introslides/nmp2022introslides.pdf
Modified: 2022-08-08 - 597KB Find Similar Documents
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