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- 1:
Method and Apparatus for Sampling and Predicting Rare Events...
- Method and Apparatus for Sampling and Predicting Rare Events in Complex Electronic Devices, Circuits and Systems Application Type: Utility Patent Number: 8155938 Country: United ...
URL: https://www.src.org/library/patent/p1078/
Modified: 2012-04-10 - 24KB
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- 2:
Method and Apparatus For Rapidly Modeling and Simulating Intra...
- Method and Apparatus For Rapidly Modeling and Simulating Intra-Die Statistical Variations in Integrated Circuits using Compressed Parameter Models Application Type: Utility Patent ...
URL: https://www.src.org/library/patent/p1160/
Modified: 2012-10-16 - 24KB
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- 3:
Systems, Methods and Computer Program Products for Creating Hierarchic...
- Systems, Methods and Computer Program Products for Creating Hierarchical Equivalent Circuit Models Application Type: Utility Patent Number: 7096174 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0200/
Modified: 2006-08-22 - 24KB
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- 4:
2005 GRC Compelling Research Report - SRC
- 2005 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 658 Nanostructure & Integration Sciences Role ...
URL: https://www.src.org/...ive/2005/compelling-research-reasons/
Modified: 2010-06-26 - 189KB
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- 5:
2007 GRC compelling research reasons - SRC
- 2007 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 1241 Computer Aided Design & Test Sciences A ...
URL: https://www.src.org/...ive/2007/compelling-research-reasons/
Modified: 2010-06-26 - 167KB
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- 6:
 Final Report - Workshop on Failure and Uncertainty in Mixed-Signal...
- National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB
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- 7:
Built-in Current Testing of Integrated Circuits (Patent P0109...
- Built-in Current Testing of Integrated Circuits Application Type: Utility Patent Number: 5025344 Country: United States Status: Filed on 22-Feb-1990, Issued on 18-Jun-1991, Patent ...
URL: https://www.src.org/library/patent/p0109/
Modified: 1991-06-18 - 22KB
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- 8:
Test Pattern Generation for an Electronic Circuit Using a Transformed...
- Test Pattern Generation for an Electronic Circuit Using a Transformed Circuit Description Application Type: Utility Patent Number: 5528604 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0075/
Modified: 1996-06-18 - 22KB
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- 9:
System and Method to Test Integrated Circuits on a Wafer (Patent...
- System and Method to Test Integrated Circuits on a Wafer Application Type: Utility Patent Number: 7325180 Country: United States Status: Filed on 26-Nov-2003, Issued on ...
URL: https://www.src.org/library/patent/p0413/
Modified: 2008-01-29 - 22KB
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- 10:
Fully Differential Operational Amplifier having Frequency Dependent...
- Fully Differential Operational Amplifier having Frequency Dependent Impedance Division Application Type: Utility Patent Number: 5146179 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0148/
Modified: 1992-09-08 - 22KB
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- 11:
Method and System to Check Correspondence between Different Representa...
- Method and System to Check Correspondence between Different Representations of a Circuit Application Type: Continuation (in part) Patent Number: 7418680 Country: United States ...
URL: https://www.src.org/library/patent/p0476/
Modified: 2008-08-26 - 22KB
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- 12:
Methods, Systems, and Computer Program Products for Modeling...
- Methods, Systems, and Computer Program Products for Modeling inductive Effects in a circuit combing a plurality of localized models Application Type: Utility Patent Number: 6820245 ...
URL: https://www.src.org/library/patent/p0251/
Modified: 2004-11-16 - 23KB
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- 13:
Method and System to Verify a Circuit Design By Verifying Consistency...
- Method and System to Verify a Circuit Design By Verifying Consistency Between Two Different Language Representations of a Circuit Design Application Type: Utility Patent Number: ...
URL: https://www.src.org/library/patent/p0424/
Modified: 2007-05-29 - 22KB
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- 14:
Methods for Characterizing, Generating Test Sequences for, and...
- Methods for Characterizing, Generating Test Sequences for, and Simulating Integrated Circuit Faults Using Fault Tuples and Related Systems and Computer Program Products Application ...
URL: https://www.src.org/library/patent/p0228/
Modified: 2004-12-28 - 22KB
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- 15:
2006 GRC compelling research reasons - SRC
- 2006 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 1190 Integrated Circuit & Systems Sciences ...
URL: https://www.src.org/...ive/2006/compelling-research-reasons/
Modified: 2010-06-26 - 200KB
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- 16:
India Design Review (Event E005563) - SRC
- India Design Review Date: Wednesday, Jan. 7, 2015, 6 p.m. - Thursday, Jan. 8, 2015, 5 p.m. Local Location: Hyatt Bangalore, 1/1, Swami Vivekananda Road, Off M.G. Road, Ulsoor, ...
URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB
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- 17:
2008 GRC compelling research reasons - SRC
- 2008 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 1292 Interconnect & Packaging Sciences The New ...
URL: https://www.src.org/...ive/2008/compelling-research-reasons/
Modified: 2010-06-26 - 188KB
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- 18:
SRC/NSF/A*STAR Forum on 2020 Semiconductor Memory Strategies...
- SRC/NSF/A*STAR Forum on 2020 Semiconductor Memory Strategies: Processes, Devices and Architectures (by invitation only) Date: Tuesday, Oct. 20, 2009, 8:30 a.m. - Wednesday, Oct. ...
URL: https://www.src.org/calendar/e003676/
Modified: 2010-04-21 - 45KB
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- 19:
3D IC University Research e-Workshop (Event E004357) - SRC
- 3D IC University Research e-Workshop Date: Thursday, May 5, 2011, noon-4:30 p.m. ET Location: SRC Conference Room D; via web conference, Research Triangle Park, NC, United States ...
URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB
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- 20:
E003676 - SRC/NSF/A*STAR Forum on 2020 Semiconductor Memory Strategies...
- SRC/NSF/A*STAR Forum on 2020 Semiconductor Memory Strategies: Processes, Devices, and Architectures I. Introduction In 1957, Richard Feynman asked in a lecture at Caltech if it ...
URL: https://www.src.org/calendar/e003676/finalreport.pdf
Modified: 2010-07-29 - 526KB
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- 21:
Current Signatures for IDDQ Testing (Patent P0084) - SRC
- Current Signatures for IDDQ Testing Application Type: Utility Patent Number: 6175244 Country: United States Status: Filed on 25-Apr-1997, Issued on 16-Jan-2001, Patent Expired ...
URL: https://www.src.org/library/patent/p0084/
Modified: 2001-01-16 - 22KB
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- 22:
Method and Apparatus for Analysing and Modeling of Analog Systems...
- Method and Apparatus for Analysing and Modeling of Analog Systems Application Type: European Patent Office Patent Number: 02761590.5 Status: Issued on 19-Feb-2011, Patent Expired ...
URL: https://www.src.org/library/patent/p0465/
Modified: 2011-02-19 - 22KB
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- 23:
Method and System for Systematic Defect Identification (Patent...
- Method and System for Systematic Defect Identification Application Type: Utility Patent Number: 8509517 Country: United States Status: Filed on 29-Dec-2010, Issued on 13-Aug-2013 ...
URL: https://www.src.org/library/patent/p1262/
Modified: 2013-08-13 - 23KB
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- 24:
Configurable Circuits Using Phase Change Switches (Patent P0534...
- Configurable Circuits Using Phase Change Switches Application Type: Utility Patent Number: 7634248 Country: United States Status: Filed on 1-Aug-2006, Issued on 15-Dec-2009, Patent ...
URL: https://www.src.org/library/patent/p0534/
Modified: 2009-12-15 - 22KB
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- 25:
Method and Apparatus for Simulating a Microelectronic Circuit...
- Method and Apparatus for Simulating a Microelectronic Circuit Application Type: Utility Patent Number: 5313398 Country: United States Status: Filed on 23-Jul-1992, Issued on ...
URL: https://www.src.org/library/patent/p0070/
Modified: 1994-05-17 - 21KB
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- 26:
Trustworthy and Secure Semiconductors and Systems (T3S) Review...
- Trustworthy and Secure Semiconductors and Systems (T3S) Review Date: Tuesday, July 30, 2019, 8 a.m. - Wednesday, July 31, 2019, 6 p.m. CT Location: ARM Encino Trace 5707 Southwest ...
URL: https://www.src.org/calendar/e006645/
Modified: 2019-08-08 - 84KB
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- 27:
Self-Timing Integrated Circuits Having Low Clock Signal during...
- Self-Timing Integrated Circuits Having Low Clock Signal during Inactive Periods Application Type: Utility Patent Number: 5324992 Country: United States Status: Filed on 1-Jul-1992, ...
URL: https://www.src.org/library/patent/p0232/
Modified: 1994-06-28 - 21KB
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- 28:
NMS Nanoengineered Materials Annual Review (Event E004780) -...
- NMS Nanoengineered Materials Annual Review Date: Tuesday, June 12, 2012 - Wednesday, June 13, 2012 Location: Dean's Suite 290, College of Business, 1307 West Highland St., ...
URL: https://www.src.org/calendar/e004780/
Modified: 2012-12-13 - 57KB
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- 29:
ESH e-Workshop: Experimental Evaluation of Degradation Rates...
- ESH e-Workshop: Experimental Evaluation of Degradation Rates and Transformation Products of Fluorinated Polymers used During Semiconductor Manufacturing To Local Calendar Add Add ...
URL: https://www.src.org/calendar/e007895/
Modified: 2024-03-28 - 401KB
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- 30:
Microsoft PowerPoint - SessionII_agenda_ver2_burnham updated...
- 2009 GRC ETAB Summer Study La Quinta Golf Resort, CA June 29-30, 2009 Session II: Systems, Software, and Applications Research for the Semiconductor Industry Working Committee ...
URL: https://www.src.org/...ndar/e003506/01-sessionii-burnham.pdf
Modified: 2011-06-17 - 150KB
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