Questions?
[x] SRC Program
GRC

[x] GRC Science Area
CADTS – Computer Aided Design & Test Sciences

Content Type
Patent Filings 82
Events 13
Other 1

Year
2015 3
2011 9
2010 1

Center
TxACE 6
C2S2 2
ACE4S 1
CAIST 1
CDADIC 1
CEMPI 1
CHIRP 1
EBSM 1
GSRC 1
IPC 1
NCRC 1

Thrust/Theme
TT – Test & Testability 37
LPD – Logic & Physical Design 23
CADT – Computer-Aided Design and... 14
VER – Verification 9
DesTech – Design Techniques 6
Physical Design 5
TechCAD – Technology CAD 5
AMS-CSD – Analog/Mixed-Signal Ci... 4
CD – Circuit Design 4
HWS – Hardware Security 4
ISD – Integrated System Design 4
SLD – System Level Design 4
DV – Design Verification 2
DesSyn – Design Synthesis 2
I3T – Innovative and Intelligent... 2
Modeling & Simulation 2
Synthesis & Verification 2
ADS – Alternative Device Structu... 1
AIHW – Artificial Intelligence H... 1
AMS – Analog and Mixed-Signal De... 1
AdvTech – Advanced Technology 1
Advanced Bipolar SOI-MOS Transis... 1
Advanced Devices 1
Advanced Devices & Technologies 1
Advanced Technology Option 1
Analysis Design & Simulation 1
BEP – Back End Processes 1
Back End Processes 1
C&S – Controls and Sensing 1
CFM&TCM – CFM & Total Chemical M... 1
CM – Compact Modeling 1
CSR – Cross-Disciplinary Semicon... 1
Contamination Control 1
Cost Reduction 1
DCMOS – Digital CMOS Technologie... 1
DE – Design Environment 1
DSMS – Device Sciences Modeling ... 1
Defect Reduction 1
Deposition 1
Doping Technologies 1
EP3C – Efficiency and Performanc... 1
ESH – Environment Safety and Hea... 1
Equip Automation & Process Contr... 1
Equip – Equipment 1
Equip. Auto. and Process Control 1
FACSYS – Factory Systems 1
FAM – Factory Automation & Manag... 1
FEOL – FEOL Processes 1
FacOps – Factory Operations 1
Factory Systems 1
Front End Processes 1
Heat Signal & Power Distribution 1
Heat Signal Power 1
Interconnect Architecture 1
LMD – Logic and Memory Devices 1
Lithography 1
Logic Design 1
Logistics & Modeling/Simulation 1
MT – Memory Technologies 1
MTMP – Metrology Tools Matls & P... 1
Masks 1
Materials 1
Materials & Measurements 1
Metrology 1
Modeling & TCAD 1
Multi-level Interconnect 1
NCR – Non-Classical CMOS Researc... 1
NEM – Nanoengineered Materials 1
NMP – Nanomanufacturing Material... 1
PAT – Patterning 1
PKG – Packaging 1
PMM – Packaging Materials and Me... 1
PMS – Packaging Modeling and Sim... 1
PS/E – Process Simplification/En... 1
Package & Electrical Design 1
Package Reliability 1
Packaging & Interconnect Systems 1
Packaging Materials Interfaces 1
Pat(MPS) – Patterning 1
PatMat – Patterning Materials 1
PatSys – Patterning Systems 1
PhyDes – Physical Design 1
Plasma Etch 1
Process Architecture 1
Processes – Processes 1
Quality & Reliability 1
Rapid Yield Learning 1
Reliability 1
Resist 1
SemiSynBio – Semiconductor Synth... 1
Semiconductor Modeling & Simulat... 1
Signal/Power Management 1
Substrates 1
TCAD-MBPS 1
TM – Thermal Management 1

1 through 30 of 96 similar documents, best matches first.   
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1: System and Method to Test Integrated Circuits on a Wafer (Patent...
System and Method to Test Integrated Circuits on a Wafer Application Type: Utility Patent Number: 7325180 Country: United States Status: Filed on 26-Nov-2003, Issued on ...
URL: https://www.src.org/library/patent/p0413/
Modified: 2008-01-29 - 22KB
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URL: https://www.src.org/library/patent/p0200/
Modified: 2006-08-22 - 24KB
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URL: https://www.src.org/library/patent/p0534/
Modified: 2009-12-15 - 22KB
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URL: https://www.src.org/library/patent/p0251/
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Built-in Current Testing of Integrated Circuits Application Type: Utility Patent Number: 5025344 Country: United States Status: Filed on 22-Feb-1990, Issued on 18-Jun-1991, Patent ...
URL: https://www.src.org/library/patent/p0109/
Modified: 1991-06-18 - 22KB
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URL: https://www.src.org/calendar/e004357/
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URL: https://www.src.org/library/patent/p1078/
Modified: 2012-04-10 - 24KB
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11: Method and System to Check Correspondence between Different Representa...
Method and System to Check Correspondence between Different Representations of a Circuit Application Type: Continuation (in part) Patent Number: 7418680 Country: United States ...
URL: https://www.src.org/library/patent/p0476/
Modified: 2008-08-26 - 22KB
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12: Method and Apparatus for Simulating a Microelectronic Circuit...
Method and Apparatus for Simulating a Microelectronic Circuit Application Type: Utility Patent Number: 5313398 Country: United States Status: Filed on 23-Jul-1992, Issued on ...
URL: https://www.src.org/library/patent/p0070/
Modified: 1994-05-17 - 21KB
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13: Method and System to Verify a Circuit Design By Verifying Consistency...
Method and System to Verify a Circuit Design By Verifying Consistency Between Two Different Language Representations of a Circuit Design Application Type: Utility Patent Number: ...
URL: https://www.src.org/library/patent/p0424/
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14: India Design Review (Event E005563) - SRC
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URL: https://www.src.org/calendar/e005563/
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URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB
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16: Method and System for Synthesizing Relative Timing Constraints...
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17: Method and System for Synthesizing Relative Timing Constraints...
Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification Application Type: Utility Patent Number: 8239796 ...
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Method and Apparatus for Simulating a Microelectric Interconnect Circuit Application Type: Utility Patent Number: 5379231 Country: United States Status: Filed on 29-May-1992, ...
URL: https://www.src.org/library/patent/p0046/
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19: Method for Testing Analog and Mixed-Signal Circuits Using Functionally...
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URL: https://www.src.org/library/patent/p0458/
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Charge-Based Frequency Measurement BIST Application Type: Utility Patent Number: 6885700 Country: United States Status: Filed on 23-Sep-1999, Issued on 26-Apr-2005, Patent ...
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ESD/EOS Protection Circuits for Integrated Circuits Application Type: Utility Patent Number: 5450267 Country: United States Status: Filed on 31-Mar-1993, Issued on 12-Sep-1995, ...
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1 through 30 of 96 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 4 next >>