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GRC

Content Type
Patent Filings 553
Events 200
Other 128

Year
2024 3
2023 10
2022 13
2021 9
2020 8
2019 8
2018 30
2017 10
2016 9
2015 28
2014 4
2013 6
2012 9
2011 118
2010 60
2009 1
2008 1

Center
TxACE 42
ACE4S 23
EBSM 17
CHIRP 7
CEMPI 4
CAIST 3
C2S2 2
FENA 2
GSRC 2
NCRC 2
C-SPIN 1
CDADIC 1
CNFD 1
CRISP 1
IPC 1
NRI-NSF 1

Thrust/Theme
CD – Circuit Design 63
PAT – Patterning 47
TT – Test & Testability 39
AMS-CSD – Analog/Mixed-Signal Ci... 30
Advanced Devices & Technologies 27
HWS – Hardware Security 27
SLD – System Level Design 27
ISD – Integrated System Design 25
I3T – Innovative and Intelligent... 24
LPD – Logic & Physical Design 23
NMP – Nanomanufacturing Material... 23
PKG – Packaging 22
CADT – Computer-Aided Design and... 21
Factory Systems 18
NEM – Nanoengineered Materials 18
ESH – Environment Safety and Hea... 16
Pat(MPS) – Patterning 16
BEP – Back End Processes 14
ADS – Alternative Device Structu... 9
DCMOS – Digital CMOS Technologie... 9
VER – Verification 9
Back End Processes 8
DesTech – Design Techniques 7
Doping Technologies 7
LMD – Logic and Memory Devices 7
MT – Memory Technologies 7
PatMat – Patterning Materials 7
CFM&TCM – CFM & Total Chemical M... 6
Packaging & Interconnect Systems 5
Physical Design 5
TechCAD – Technology CAD 5
AIHW – Artificial Intelligence H... 4
Lithography 4
MTMP – Metrology Tools Matls & P... 4
Masks 4
Materials 4
Modeling & Simulation 4
SemiSynBio – Semiconductor Synth... 4
DesSyn – Design Synthesis 3
FACSYS – Factory Systems 3
Multi-level Interconnect 3
Processes – Processes 3
AMS – Analog and Mixed-Signal De... 2
AdvTech – Advanced Technology 2
C&S – Controls and Sensing 2
CM – Compact Modeling 2
DV – Design Verification 2
Deposition 2
EP3C – Efficiency and Performanc... 2
Front End Processes 2
Metrology 2
Reliability 2
Synthesis & Verification 2
Advanced Bipolar SOI-MOS Transis... 1
Advanced Devices 1
Advanced Technology Option 1
Analysis Design & Simulation 1
CRISP-T1 – Hardware Support for ... 1
CSR – Cross-Disciplinary Semicon... 1
Contamination Control 1
Cost Reduction 1
DE – Design Environment 1
DSMS – Device Sciences Modeling ... 1
Defect Reduction 1
Equip Automation & Process Contr... 1
Equip – Equipment 1
Equip. Auto. and Process Control 1
FAM – Factory Automation & Manag... 1
FEOL – FEOL Processes 1
FacOps – Factory Operations 1
Heat Signal & Power Distribution 1
Heat Signal Power 1
Interconnect Architecture 1
Logic Design 1
Logistics & Modeling/Simulation 1
Materials & Measurements 1
Modeling & TCAD 1
NCR – Non-Classical CMOS Researc... 1
PMM – Packaging Materials and Me... 1
PMS – Packaging Modeling and Sim... 1
PS/E – Process Simplification/En... 1
Package & Electrical Design 1
Package Reliability 1
Packaging Materials Interfaces 1
PatSys – Patterning Systems 1
PhyDes – Physical Design 1
Plasma Etch 1
Process Architecture 1
Quality & Reliability 1
Rapid Yield Learning 1
Resist 1
Semiconductor Modeling & Simulat... 1
Signal/Power Management 1
Substrates 1
TCAD-MBPS 1
TM – Thermal Management 1

GRC Science Area
MPS – Material & Process Science... 120
ICSS – Integrated Circuit & Syst... 106
NMS – Nanomanufacturing Sciences 104
NIS – Nanostructure & Integratio... 101
CADTS – Computer Aided Design & ... 96
LIT – Lithography Sciences 42
IPS – Interconnect & Packaging S... 39
DS – Device Sciences 34
MIC – Microstructure Sciences 33
DES – Design Sciences 31
PID – Process Integration & Devi... 29
MBP – Materials & Bulk Processes... 24
INT – Interconnect Sciences 12
ES-H – Environmental Safety & He... 10
MFGPS – Manufacturing Process Sc... 5
PKG – Packaging Sciences 5
CSR – Cross-disciplinary Semicon... 2
FAC – Factory Sciences 2
GEN – General 1
ISA – Industrial Support Activit... 1
MFG – Manufacturing Sciences 1
MSS – Manufacturing Systems Scie... 1
SMS – Semiconductor Modeling & S... 1
SRCEA – SRC Education Alliance 1
TT – Technology Transfer 1

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1: System and Method to Test Integrated Circuits on a Wafer (Patent...
System and Method to Test Integrated Circuits on a Wafer Application Type: Utility Patent Number: 7325180 Country: United States Status: Filed on 26-Nov-2003, Issued on ...
URL: https://www.src.org/library/patent/p0413/
Modified: 2008-01-29 - 22KB
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URL: https://www.src.org/library/patent/p0465/
Modified: 2011-02-19 - 22KB
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URL: https://www.src.org/library/patent/p0200/
Modified: 2006-08-22 - 24KB
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4: Configurable Circuits Using Phase Change Switches (Patent P0534...
Configurable Circuits Using Phase Change Switches Application Type: Utility Patent Number: 7634248 Country: United States Status: Filed on 1-Aug-2006, Issued on 15-Dec-2009, Patent ...
URL: https://www.src.org/library/patent/p0534/
Modified: 2009-12-15 - 22KB
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URL: https://www.src.org/library/patent/p0251/
Modified: 2004-11-16 - 23KB
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6: 2006 GRC compelling research reasons - SRC
2006 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 1190 Integrated Circuit & Systems Sciences ...
URL: https://www.src.org/...ive/2006/compelling-research-reasons/
Modified: 2010-06-26 - 200KB
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7: Built-in Current Testing of Integrated Circuits (Patent P0109...
Built-in Current Testing of Integrated Circuits Application Type: Utility Patent Number: 5025344 Country: United States Status: Filed on 22-Feb-1990, Issued on 18-Jun-1991, Patent ...
URL: https://www.src.org/library/patent/p0109/
Modified: 1991-06-18 - 22KB
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8: Method and Apparatus For Rapidly Modeling and Simulating Intra...
Method and Apparatus For Rapidly Modeling and Simulating Intra-Die Statistical Variations in Integrated Circuits using Compressed Parameter Models Application Type: Utility Patent ...
URL: https://www.src.org/library/patent/p1160/
Modified: 2012-10-16 - 24KB
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9: Self-Timing Integrated Circuits Having Low Clock Signal during...
Self-Timing Integrated Circuits Having Low Clock Signal during Inactive Periods Application Type: Utility Patent Number: 5324992 Country: United States Status: Filed on 1-Jul-1992, ...
URL: https://www.src.org/library/patent/p0232/
Modified: 1994-06-28 - 21KB
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10: Methods for Characterizing, Generating Test Sequences for, and...
Methods for Characterizing, Generating Test Sequences for, and Simulating Integrated Circuit Faults Using Fault Tuples and Related Systems and Computer Program Products Application ...
URL: https://www.src.org/library/patent/p0228/
Modified: 2004-12-28 - 22KB
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11: 2007 GRC compelling research reasons - SRC
2007 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 1241 Computer Aided Design & Test Sciences A ...
URL: https://www.src.org/...ive/2007/compelling-research-reasons/
Modified: 2010-06-26 - 167KB
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12: 3D IC University Research e-Workshop (Event E004357) - SRC
3D IC University Research e-Workshop Date: Thursday, May 5, 2011, noon-4:30 p.m. ET Location: SRC Conference Room D; via web conference, Research Triangle Park, NC, United States ...
URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB
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13: Current Signatures for IDDQ Testing (Patent P0084) - SRC
Current Signatures for IDDQ Testing Application Type: Utility Patent Number: 6175244 Country: United States Status: Filed on 25-Apr-1997, Issued on 16-Jan-2001, Patent Expired ...
URL: https://www.src.org/library/patent/p0084/
Modified: 2001-01-16 - 22KB
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14: Method and System for Systematic Defect Identification (Patent...
Method and System for Systematic Defect Identification Application Type: Utility Patent Number: 8509517 Country: United States Status: Filed on 29-Dec-2010, Issued on 13-Aug-2013 ...
URL: https://www.src.org/library/patent/p1262/
Modified: 2013-08-13 - 23KB
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15: Oriented Crystal Nanowire Interconnects (Patent P1479) - SRC
Oriented Crystal Nanowire Interconnects Application Type: Utility Patent Number: 9117821 Country: United States Status: Filed on 11-Mar-2014, Issued on 25-Aug-2015, Patent ...
URL: https://www.src.org/library/patent/p1479/
Modified: 2015-08-25 - 23KB
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16: Method and Apparatus for Sampling and Predicting Rare Events...
Method and Apparatus for Sampling and Predicting Rare Events in Complex Electronic Devices, Circuits and Systems Application Type: Utility Patent Number: 8155938 Country: United ...
URL: https://www.src.org/library/patent/p1078/
Modified: 2012-04-10 - 24KB
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17: Fully Differential Operational Amplifier having Frequency Dependent...
Fully Differential Operational Amplifier having Frequency Dependent Impedance Division Application Type: Utility Patent Number: 5146179 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0148/
Modified: 1992-09-08 - 22KB
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18: Method and System to Check Correspondence between Different Representa...
Method and System to Check Correspondence between Different Representations of a Circuit Application Type: Continuation (in part) Patent Number: 7418680 Country: United States ...
URL: https://www.src.org/library/patent/p0476/
Modified: 2008-08-26 - 22KB
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19: Test Pattern Generation for an Electronic Circuit Using a Transformed...
Test Pattern Generation for an Electronic Circuit Using a Transformed Circuit Description Application Type: Utility Patent Number: 5528604 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0075/
Modified: 1996-06-18 - 22KB
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20: Method and Apparatus for Simulating a Microelectronic Circuit...
Method and Apparatus for Simulating a Microelectronic Circuit Application Type: Utility Patent Number: 5313398 Country: United States Status: Filed on 23-Jul-1992, Issued on ...
URL: https://www.src.org/library/patent/p0070/
Modified: 1994-05-17 - 21KB
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21: Deterministic Seeding of Switching Filament Oxide-Based Memristive...
Deterministic Seeding of Switching Filament Oxide-Based Memristive Devices Application Type: Utility Patent Number: 9997700 Country: United States Status: Filed on 1-May-2014, ...
URL: https://www.src.org/library/patent/p1483/
Modified: 2018-06-12 - 22KB
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22: Method and System to Verify a Circuit Design By Verifying Consistency...
Method and System to Verify a Circuit Design By Verifying Consistency Between Two Different Language Representations of a Circuit Design Application Type: Utility Patent Number: ...
URL: https://www.src.org/library/patent/p0424/
Modified: 2007-05-29 - 22KB
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23: Static RAM Memory Cell Using N-Channel MOS Transistors (Patent...
Static RAM Memory Cell Using N-Channel MOS Transistors Application Type: Utility Patent Number: 5051951 Country: United States Status: Filed on 8-Feb-1991, Issued on 24-Sep-1991, ...
URL: https://www.src.org/library/patent/p0105/
Modified: 1991-09-24 - 21KB
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24: 2005 GRC Compelling Research Report - SRC
2005 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 658 Nanostructure & Integration Sciences Role ...
URL: https://www.src.org/...ive/2005/compelling-research-reasons/
Modified: 2010-06-26 - 189KB
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25: India Design Review (Event E005563) - SRC
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URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB
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26: 2008 GRC compelling research reasons - SRC
2008 GRC Compelling Research Reasons Advanced Micro Devices, Inc. next company Newly Recognized ID Science Areas Title PI Start Date 1292 Interconnect & Packaging Sciences The New ...
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Modified: 2010-06-26 - 188KB
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URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB
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URL: https://www.src.org/library/patent/p1354/
Modified: 2012-11-27 - 24KB
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Dynamic Functional Obfuscation Application Type: Utility Patent Number: 11061997 Country: United States Status: Filed on 3-Aug-2017, Issued on 13-Jul-2021 Organization: University ...
URL: https://www.src.org/library/patent/p1727/
Modified: 2021-07-13 - 27KB
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1 through 30 of 881 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 3 4 5 6 7 8 9 10 next >>