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TxACE	33
ACE4S	22
EBSM	4
CEMPI	3
C2S2	2
CAIST	2
FENA	2
GSRC	2
C-SPIN	1
CHIRP	1
CNFD	1
CRISP	1
NCRC	1
NRI-NSF	1

Thrust/Theme

CD – Circuit Design	59
PAT – Patterning	43
TT – Test & Testability	35
Advanced Devices & Technologies	26
SLD – System Level Design	23
AMS-CSD – Analog/Mixed-Signal Ci...	22
I3T – Innovative and Intelligent...	22
HWS – Hardware Security	21
ISD – Integrated System Design	21
LPD – Logic & Physical Design	19
CADT – Computer-Aided Design and...	17
Factory Systems	17
NMP – Nanomanufacturing Material...	15
Pat(MPS) – Patterning	15
PKG – Packaging	14
BEP – Back End Processes	13
NEM – Nanoengineered Materials	13
ADS – Alternative Device Structu...	8
DCMOS – Digital CMOS Technologie...	8
Back End Processes	7
DesTech – Design Techniques	6
Doping Technologies	6
MT – Memory Technologies	6
PatMat – Patterning Materials	6
CFM&TCM – CFM & Total Chemical M...	5
VER – Verification	5
ESH – Environment Safety and Hea...	4
Packaging & Interconnect Systems	4
Physical Design	4
TechCAD – Technology CAD	4
AIHW – Artificial Intelligence H...	3
Lithography	3
MTMP – Metrology Tools Matls & P...	3
Masks	3
Materials	3
Modeling & Simulation	3
SemiSynBio – Semiconductor Synth...	3
DesSyn – Design Synthesis	2
LMD – Logic and Memory Devices	2
Multi-level Interconnect	2
Processes – Processes	2
AMS – Analog and Mixed-Signal De...	1
AdvTech – Advanced Technology	1
C&S – Controls and Sensing	1
CM – Compact Modeling	1
CRISP-T1 – Hardware Support for ...	1
DV – Design Verification	1
Deposition	1
Front End Processes	1
Metrology	1
Reliability	1
Synthesis & Verification	1

GRC Science Area

MPS – Material & Process Science...	119
NIS – Nanostructure & Integratio...	100
ICSS – Integrated Circuit & Syst...	92
CADTS – Computer Aided Design & ...	82
NMS – Nanomanufacturing Sciences	82
LIT – Lithography Sciences	41
DS – Device Sciences	33
IPS – Interconnect & Packaging S...	32
MIC – Microstructure Sciences	32
DES – Design Sciences	30
PID – Process Integration & Devi...	28
MBP – Materials & Bulk Processes...	23
INT – Interconnect Sciences	11
MFGPS – Manufacturing Process Sc...	4
ES-H – Environmental Safety & He...	3
FAC – Factory Sciences	1

1 through 30 of 553 similar documents, best matches first.

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1: Built-in Current Testing of Integrated Circuits (Patent P0109...: Built-in Current Testing of Integrated Circuits Application Type: Utility Patent Number: 5025344 Country: United States Status: Filed on 22-Feb-1990, Issued on 18-Jun-1991, Patent ...
URL: https://www.src.org/library/patent/p0109/
Modified: 1991-06-18 - 22KB
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2: Current Signatures for IDDQ Testing (Patent P0084) - SRC: Current Signatures for IDDQ Testing Application Type: Utility Patent Number: 6175244 Country: United States Status: Filed on 25-Apr-1997, Issued on 16-Jan-2001, Patent Expired ...
URL: https://www.src.org/library/patent/p0084/
Modified: 2001-01-16 - 22KB
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3: Methods for Characterizing, Generating Test Sequences for, and...: Methods for Characterizing, Generating Test Sequences for, and Simulating Integrated Circuit Faults Using Fault Tuples and Related Systems and Computer Program Products Application ...
URL: https://www.src.org/library/patent/p0228/
Modified: 2004-12-28 - 22KB
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4: System and Method to Test Integrated Circuits on a Wafer (Patent...: System and Method to Test Integrated Circuits on a Wafer Application Type: Utility Patent Number: 7325180 Country: United States Status: Filed on 26-Nov-2003, Issued on ...
URL: https://www.src.org/library/patent/p0413/
Modified: 2008-01-29 - 22KB
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5: Method and Apparatus For Rapidly Modeling and Simulating Intra...: Method and Apparatus For Rapidly Modeling and Simulating Intra-Die Statistical Variations in Integrated Circuits using Compressed Parameter Models Application Type: Utility Patent ...
URL: https://www.src.org/library/patent/p1160/
Modified: 2012-10-16 - 24KB
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6: Self-Timing Integrated Circuits Having Low Clock Signal during...: Self-Timing Integrated Circuits Having Low Clock Signal during Inactive Periods Application Type: Utility Patent Number: 5324992 Country: United States Status: Filed on 1-Jul-1992, ...
URL: https://www.src.org/library/patent/p0232/
Modified: 1994-06-28 - 21KB
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7: Method and Apparatus for Analysing and Modeling of Analog Systems...: Method and Apparatus for Analysing and Modeling of Analog Systems Application Type: European Patent Office Patent Number: 02761590.5 Status: Issued on 19-Feb-2011, Patent Expired ...
URL: https://www.src.org/library/patent/p0465/
Modified: 2011-02-19 - 22KB
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8: Configurable Circuits Using Phase Change Switches (Patent P0534...: Configurable Circuits Using Phase Change Switches Application Type: Utility Patent Number: 7634248 Country: United States Status: Filed on 1-Aug-2006, Issued on 15-Dec-2009, Patent ...
URL: https://www.src.org/library/patent/p0534/
Modified: 2009-12-15 - 22KB
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9: Systems, Methods and Computer Program Products for Creating Hierarchic...: Systems, Methods and Computer Program Products for Creating Hierarchical Equivalent Circuit Models Application Type: Utility Patent Number: 7096174 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0200/
Modified: 2006-08-22 - 24KB
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10: Fully Differential Operational Amplifier having Frequency Dependent...: Fully Differential Operational Amplifier having Frequency Dependent Impedance Division Application Type: Utility Patent Number: 5146179 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0148/
Modified: 1992-09-08 - 22KB
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11: Method and System to Check Correspondence between Different Representa...: Method and System to Check Correspondence between Different Representations of a Circuit Application Type: Continuation (in part) Patent Number: 7418680 Country: United States ...
URL: https://www.src.org/library/patent/p0476/
Modified: 2008-08-26 - 22KB
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12: Method and System for Systematic Defect Identification (Patent...: Method and System for Systematic Defect Identification Application Type: Utility Patent Number: 8509517 Country: United States Status: Filed on 29-Dec-2010, Issued on 13-Aug-2013 ...
URL: https://www.src.org/library/patent/p1262/
Modified: 2013-08-13 - 23KB
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13: Method and Apparatus for Simulating a Microelectronic Circuit...: Method and Apparatus for Simulating a Microelectronic Circuit Application Type: Utility Patent Number: 5313398 Country: United States Status: Filed on 23-Jul-1992, Issued on ...
URL: https://www.src.org/library/patent/p0070/
Modified: 1994-05-17 - 21KB
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14: Methods, Systems, and Computer Program Products for Modeling...: Methods, Systems, and Computer Program Products for Modeling inductive Effects in a circuit combing a plurality of localized models Application Type: Utility Patent Number: 6820245 ...
URL: https://www.src.org/library/patent/p0251/
Modified: 2004-11-16 - 23KB
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15: Test Pattern Generation for an Electronic Circuit Using a Transformed...: Test Pattern Generation for an Electronic Circuit Using a Transformed Circuit Description Application Type: Utility Patent Number: 5528604 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0075/
Modified: 1996-06-18 - 22KB
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16: Method and Apparatus for Sampling and Predicting Rare Events...: Method and Apparatus for Sampling and Predicting Rare Events in Complex Electronic Devices, Circuits and Systems Application Type: Utility Patent Number: 8155938 Country: United ...
URL: https://www.src.org/library/patent/p1078/
Modified: 2012-04-10 - 24KB
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17: Deterministic Seeding of Switching Filament Oxide-Based Memristive...: Deterministic Seeding of Switching Filament Oxide-Based Memristive Devices Application Type: Utility Patent Number: 9997700 Country: United States Status: Filed on 1-May-2014, ...
URL: https://www.src.org/library/patent/p1483/
Modified: 2018-06-12 - 22KB
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18: Static RAM Memory Cell Using N-Channel MOS Transistors (Patent...: Static RAM Memory Cell Using N-Channel MOS Transistors Application Type: Utility Patent Number: 5051951 Country: United States Status: Filed on 8-Feb-1991, Issued on 24-Sep-1991, ...
URL: https://www.src.org/library/patent/p0105/
Modified: 1991-09-24 - 21KB
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19: Method and System to Verify a Circuit Design By Verifying Consistency...: Method and System to Verify a Circuit Design By Verifying Consistency Between Two Different Language Representations of a Circuit Design Application Type: Utility Patent Number: ...
URL: https://www.src.org/library/patent/p0424/
Modified: 2007-05-29 - 22KB
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20: Oriented Crystal Nanowire Interconnects (Patent P1479) - SRC: Oriented Crystal Nanowire Interconnects Application Type: Utility Patent Number: 9117821 Country: United States Status: Filed on 11-Mar-2014, Issued on 25-Aug-2015, Patent ...
URL: https://www.src.org/library/patent/p1479/
Modified: 2015-08-25 - 23KB
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21: Method for Testing Analog and Mixed-Signal Circuits Using Functionally...: Method for Testing Analog and Mixed-Signal Circuits Using Functionally Related Excitations and Functionally Related Measurements Application Type: Utility Patent Number: 7129734 ...
URL: https://www.src.org/library/patent/p0458/
Modified: 2006-10-31 - 25KB
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22: Method for Testing Analog and Mixed-Signal Circuits Using Dynamic...: Method for Testing Analog and Mixed-Signal Circuits Using Dynamic Element Matching for Source Linearization Application Type: Utility Patent Number: 7587647 Country: United States ...
URL: https://www.src.org/library/patent/p0468/
Modified: 2009-09-08 - 23KB
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23: Testing Monolithic Three Dimensional Integrated Circuits (Patent...: Testing Monolithic Three Dimensional Integrated Circuits Application Type: Utility Patent Number: 10775429 Country: United States Status: Filed on 2-Nov-2017, Issued on 15-Sep-2020 ...
URL: https://www.src.org/library/patent/p1746/
Modified: 2020-09-15 - 25KB
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24: Multi-Layer Integrated Circuits Having Isolation Cells for Layer...: Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Continuation (in part) Patent Number: 10838003 Country: United States ...
URL: https://www.src.org/library/patent/p1826/
Modified: 2020-11-17 - 25KB
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25: Multi-Layer Integrated Circuits Having Isolation Cells for Layer...: Multi-Layer Integrated Circuits Having Isolation Cells for Layer Testing and Related Methods Application Type: Utility Patent Number: 10338133 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p1639/
Modified: 2019-07-02 - 25KB
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26: Integrated Circuit Having Clock-Line Control and Method for Testing...: Integrated Circuit Having Clock-Line Control and Method for Testing Same Application Type: Utility Patent Number: 5519713 Country: United States Status: Filed on 2-Dec-1993, Issued ...
URL: https://www.src.org/library/patent/p0022/
Modified: 1996-05-21 - 21KB
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27: Testing an Analog-to-Digital Converter Using Counters (Patent...: Testing an Analog-to-Digital Converter Using Counters Application Type: Utility Patent Number: 10951221 Country: United States Status: Filed on 7-Jan-2020, Issued on 16-Mar-2021 ...
URL: https://www.src.org/library/patent/p1821/
Modified: 2021-03-16 - 23KB
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28: Method for Testing and Diagnosing MOS Transistors (Patent P0188...: Method for Testing and Diagnosing MOS Transistors Application Type: Utility Patent Number: 6275059 Country: United States Status: Filed on 4-Oct-1999, Issued on 14-Aug-2001, Patent ...
URL: https://www.src.org/library/patent/p0188/
Modified: 2001-08-14 - 22KB
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29: CHARACTERIZING ABERRATIONS IN AN IMAGING LENS AND APPLICATIONS...: CHARACTERIZING ABERRATIONS IN AN IMAGING LENS AND APPLICATIONS TO VISUAL TESTING AND INTEGRATED CIRCUIT MASK ANALYSIS Application Type: Utility Patent Number: 7030997 Country: ...
URL: https://www.src.org/library/patent/p0302/
Modified: 2006-04-18 - 22KB
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30: Integrated Circuit Devices Having On-Chip Adaptive Bandwidth...: Integrated Circuit Devices Having On-Chip Adaptive Bandwidth Buses and Related Methods Application Type: Utility Patent Number: 7110420 Country: United States Status: Filed on ...
URL: https://www.src.org/library/patent/p0319/
Modified: 2006-09-19 - 23KB
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1 through 30 of 553 similar documents, best matches first.

Results by:	Page: 1 2 3 4 5 6 7 8 9 10	next >>