Questions?
[x] SRC Program
GRC

[x] GRC Science Area
CADTS – Computer Aided Design & Test Sciences

Content Type
Patent Filings 53
Events 4
Other 1

Year
2015 1
2011 2
2010 1

Center
TxACE 3
C2S2 2
ACE4S 1
CAIST 1
CDADIC 1
CEMPI 1
CHIRP 1
EBSM 1
IPC 1
NCRC 1

Thrust/Theme
TT – Test & Testability 27
LPD – Logic & Physical Design 9
CADT – Computer-Aided Design and... 7
DesTech – Design Techniques 6
Physical Design 5
TechCAD – Technology CAD 4
VER – Verification 4
AMS-CSD – Analog/Mixed-Signal Ci... 2
CD – Circuit Design 2
DV – Design Verification 2
HWS – Hardware Security 2
ISD – Integrated System Design 2
SLD – System Level Design 2
Synthesis & Verification 2
ADS – Alternative Device Structu... 1
AIHW – Artificial Intelligence H... 1
AMS – Analog and Mixed-Signal De... 1
AdvTech – Advanced Technology 1
Advanced Bipolar SOI-MOS Transis... 1
Advanced Devices 1
Advanced Devices & Technologies 1
Advanced Technology Option 1
Analysis Design & Simulation 1
BEP – Back End Processes 1
Back End Processes 1
C&S – Controls and Sensing 1
CFM&TCM – CFM & Total Chemical M... 1
CM – Compact Modeling 1
CSR – Cross-Disciplinary Semicon... 1
Contamination Control 1
Cost Reduction 1
DCMOS – Digital CMOS Technologie... 1
DE – Design Environment 1
DSMS – Device Sciences Modeling ... 1
Defect Reduction 1
Deposition 1
DesSyn – Design Synthesis 1
Doping Technologies 1
EP3C – Efficiency and Performanc... 1
ESH – Environment Safety and Hea... 1
Equip Automation & Process Contr... 1
Equip – Equipment 1
Equip. Auto. and Process Control 1
FACSYS – Factory Systems 1
FAM – Factory Automation & Manag... 1
FEOL – FEOL Processes 1
FacOps – Factory Operations 1
Factory Systems 1
Front End Processes 1
Heat Signal & Power Distribution 1
Heat Signal Power 1
I3T – Innovative and Intelligent... 1
Interconnect Architecture 1
LMD – Logic and Memory Devices 1
Lithography 1
Logic Design 1
Logistics & Modeling/Simulation 1
MT – Memory Technologies 1
MTMP – Metrology Tools Matls & P... 1
Masks 1
Materials 1
Materials & Measurements 1
Metrology 1
Modeling & Simulation 1
Modeling & TCAD 1
Multi-level Interconnect 1
NCR – Non-Classical CMOS Researc... 1
NEM – Nanoengineered Materials 1
NMP – Nanomanufacturing Material... 1
PAT – Patterning 1
PKG – Packaging 1
PMM – Packaging Materials and Me... 1
PMS – Packaging Modeling and Sim... 1
PS/E – Process Simplification/En... 1
Package & Electrical Design 1
Package Reliability 1
Packaging & Interconnect Systems 1
Packaging Materials Interfaces 1
Pat(MPS) – Patterning 1
PatMat – Patterning Materials 1
PatSys – Patterning Systems 1
PhyDes – Physical Design 1
Plasma Etch 1
Process Architecture 1
Processes – Processes 1
Quality & Reliability 1
Rapid Yield Learning 1
Reliability 1
Resist 1
SemiSynBio – Semiconductor Synth... 1
Semiconductor Modeling & Simulat... 1
Signal/Power Management 1
Substrates 1
TCAD-MBPS 1
TM – Thermal Management 1

1 through 30 of 58 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 next >>
1: Systems, Methods and Computer Program Products for Creating Hierarchic...
Systems, Methods and Computer Program Products for Creating Hierarchical Equivalent Circuit Models Application Type: Utility Patent Number: 7096174 Country: United States Status: ...
URL: https://www.src.org/library/patent/p0200/
Modified: 2006-08-22 - 24KB
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2: Methods, Systems, and Computer Program Products for Modeling...
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URL: https://www.src.org/library/patent/p0251/
Modified: 2004-11-16 - 23KB
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3: Configurable Circuits Using Phase Change Switches (Patent P0534...
Configurable Circuits Using Phase Change Switches Application Type: Utility Patent Number: 7634248 Country: United States Status: Filed on 1-Aug-2006, Issued on 15-Dec-2009, Patent ...
URL: https://www.src.org/library/patent/p0534/
Modified: 2009-12-15 - 22KB
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4: System and Method to Test Integrated Circuits on a Wafer (Patent...
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URL: https://www.src.org/library/patent/p0413/
Modified: 2008-01-29 - 22KB
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5: Method and Apparatus For Rapidly Modeling and Simulating Intra...
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URL: https://www.src.org/library/patent/p1160/
Modified: 2012-10-16 - 24KB
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6: pdfFinal Report - Workshop on Failure and Uncertainty in Mixed-Signal...
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URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB
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7: 3D IC University Research e-Workshop (Event E004357) - SRC
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URL: https://www.src.org/calendar/e004357/
Modified: 2011-11-05 - 43KB
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8: Built-in Current Testing of Integrated Circuits (Patent P0109...
Built-in Current Testing of Integrated Circuits Application Type: Utility Patent Number: 5025344 Country: United States Status: Filed on 22-Feb-1990, Issued on 18-Jun-1991, Patent ...
URL: https://www.src.org/library/patent/p0109/
Modified: 1991-06-18 - 22KB
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9: Method and Apparatus for Sampling and Predicting Rare Events...
Method and Apparatus for Sampling and Predicting Rare Events in Complex Electronic Devices, Circuits and Systems Application Type: Utility Patent Number: 8155938 Country: United ...
URL: https://www.src.org/library/patent/p1078/
Modified: 2012-04-10 - 24KB
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10: Method and System to Check Correspondence between Different Representa...
Method and System to Check Correspondence between Different Representations of a Circuit Application Type: Continuation (in part) Patent Number: 7418680 Country: United States ...
URL: https://www.src.org/library/patent/p0476/
Modified: 2008-08-26 - 22KB
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11: Method and Apparatus for Simulating a Microelectronic Circuit...
Method and Apparatus for Simulating a Microelectronic Circuit Application Type: Utility Patent Number: 5313398 Country: United States Status: Filed on 23-Jul-1992, Issued on ...
URL: https://www.src.org/library/patent/p0070/
Modified: 1994-05-17 - 21KB
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12: Method and System to Verify a Circuit Design By Verifying Consistency...
Method and System to Verify a Circuit Design By Verifying Consistency Between Two Different Language Representations of a Circuit Design Application Type: Utility Patent Number: ...
URL: https://www.src.org/library/patent/p0424/
Modified: 2007-05-29 - 22KB
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13: Methods for Characterizing, Generating Test Sequences for, and...
Methods for Characterizing, Generating Test Sequences for, and Simulating Integrated Circuit Faults Using Fault Tuples and Related Systems and Computer Program Products Application ...
URL: https://www.src.org/library/patent/p0228/
Modified: 2004-12-28 - 22KB
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14: Method and Apparatus for Simulating a Microelectric Interconnect...
Method and Apparatus for Simulating a Microelectric Interconnect Circuit Application Type: Utility Patent Number: 5379231 Country: United States Status: Filed on 29-May-1992, ...
URL: https://www.src.org/library/patent/p0046/
Modified: 1995-01-03 - 21KB
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15: India Design Review (Event E005563) - SRC
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URL: https://www.src.org/calendar/e005563/
Modified: 2015-02-04 - 82KB
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URL: https://www.src.org/library/patent/p1262/
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17: Method of Fabricating a Self-Aligned High Speed MOSFET Device...
Method of Fabricating a Self-Aligned High Speed MOSFET Device Application Type: Continuation (in part) Patent Number: 5599728 Country: United States Status: Filed on 28-Oct-1994, ...
URL: https://www.src.org/library/patent/p0006/
Modified: 1997-02-04 - 22KB
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18: Silicon-on-insulator transistors having improved current characteristi...
Silicon-on-insulator transistors having improved current characteristics and reduced electrostatic discharge susceptibility Application Type: Divisional Patent Number: 5982003 ...
URL: https://www.src.org/library/patent/p0002/
Modified: 1999-11-09 - 22KB
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19: ESD/EOS Protection Circuits for Integrated Circuits (Patent P0074...
ESD/EOS Protection Circuits for Integrated Circuits Application Type: Utility Patent Number: 5450267 Country: United States Status: Filed on 31-Mar-1993, Issued on 12-Sep-1995, ...
URL: https://www.src.org/library/patent/p0074/
Modified: 1995-09-12 - 25KB
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20: Embedded IC Test Circuits and Methods (Patent P0525) - SRC
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URL: https://www.src.org/library/patent/p0525/
Modified: 2008-05-27 - 23KB
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21: Power Detector of Embedded IC Test Circuits (Patent P1077) -...
Power Detector of Embedded IC Test Circuits Application Type: Divisional Patent Number: 7925229 Country: United States Status: Filed on 25-Apr-2008, Issued on 12-Apr-2011, Patent ...
URL: https://www.src.org/library/patent/p1077/
Modified: 2011-04-12 - 23KB
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22: Method and System for Synthesizing Relative Timing Constraints...
Method and System for Synthesizing Relative Timing Constraints on an Integrated Circuit Design to Facilitate Timing Verification Application Type: Continuation Patent Number: ...
URL: https://www.src.org/library/patent/p1354/
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23: Testing Monolithic Three Dimensional Integrated Circuits (Patent...
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URL: https://www.src.org/library/patent/p1746/
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24: Method and System for Testing an Electric Circuit (Patent P1260...
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URL: https://www.src.org/library/patent/p1260/
Modified: 2014-06-03 - 22KB
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25: Source Contact Placement for Efficient ESD/EOS Protection in...
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URL: https://www.src.org/library/patent/p0067/
Modified: 1995-04-04 - 25KB
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26: Method and System for Performing Global Routing on an Integrated...
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URL: https://www.src.org/library/patent/p1032/
Modified: 2010-02-09 - 22KB
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27: Method for Diagnosing Bridging Faults in Integrated Circuits...
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URL: https://www.src.org/library/patent/p0199/
Modified: 2001-03-13 - 23KB
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28: Method for Diagnosing Bridging Faults in Integrated Circuits...
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URL: https://www.src.org/library/patent/p0338/
Modified: 2003-05-06 - 23KB
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29: Method of placing source contacts for efficient EDS\EOS protection...
Method of placing source contacts for efficient EDS\EOS protection in grounded substrate MOS integrated circuit Application Type: Divisional Patent Number: 5468667 Country: United ...
URL: https://www.src.org/library/patent/p0373/
Modified: 1995-11-21 - 22KB
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30: Methods, Apparatus and Computer Program products for Synthesizing...
Methods, Apparatus and Computer Program products for Synthesizing Integrated Circuits with Electrostatic Discharge Capability and Correcting Ground Rule Faults Therein Application ...
URL: https://www.src.org/library/patent/p0049/
Modified: 1998-08-18 - 27KB
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1 through 30 of 58 similar documents, best matches first.   
Results by:Thunderstone Page: 1 2 next >>