[x]
GRC Science Area
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SRC Program
| Thrust/Theme |
| Deposition | 1 |
| Doping Technologies | 1 |
| Modeling & Simulation | 1 |
| Reliability | 1 |
| 1 through 4 of 4 similar documents, best matches first. | ||
- 1: Systems, Methods and Computer Program Products for Prediction...
- Systems, Methods and Computer Program Products for Prediction of Defect-Related Failures in Integrated Circuits Application Type: Utility Patent Number: 5822218 Country: United ...
URL: https://www.src.org/library/patent/p0050/
Modified: 1998-10-13 - 22KB
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- 2: Method for Forming a Layer of Uniform Thickness On a Semiconductor...
- Method for Forming a Layer of Uniform Thickness On a Semiconductor Wafer During Rapid Thermal Processing Application Type: Utility Patent Number: 5439850 Country: United States ...
URL: https://www.src.org/library/patent/p0033/
Modified: 1995-08-08 - 21KB
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- 3: Delta Doped and Counter Doped Dynamic Threshold Voltage MOSFET...
- Delta Doped and Counter Doped Dynamic Threshold Voltage MOSFET for Ultra-Low Voltage Operation Application Type: Utility Patent Number: 5780899 Country: United States Status: Filed ...
URL: https://www.src.org/library/patent/p0016/
Modified: 1998-07-14 - 22KB
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- 4: Three-Zone Rapid Thermal Processing System Utilizing Wafer Edge...
- Three-Zone Rapid Thermal Processing System Utilizing Wafer Edge Heating Means Application Type: Utility Patent Number: 5418885 Country: United States Status: Filed on 29-Dec-1992, ...
URL: https://www.src.org/library/patent/p0040/
Modified: 1995-05-23 - 22KB
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