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GRC Science Area
CADTS – Computer Aided Design & Test Sciences
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| 1 through 12 of
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- 1:
Silicon-On-Insulator Transistors Having Improved Current Characteristi...
- Silicon-On-Insulator Transistors Having Improved Current Characteristics and Reduced Electrostatic Discharge Susceptibility Application Type: Utility Patent Number: 5489792 ...
URL: https://www.src.org/library/patent/p0026/
Modified: 1996-02-06 - 22KB
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- 2:
Silicon-on-insulator transistors having improved current characteristi...
- Silicon-on-insulator transistors having improved current characteristics and reduced electrostatic discharge susceptibility Application Type: Divisional Patent Number: 5982003 ...
URL: https://www.src.org/library/patent/p0002/
Modified: 1999-11-09 - 22KB
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- 3:
Silicon-On-Insulator Transistors Having Improved Current Characteristi...
- Silicon-On-Insulator Transistors Having Improved Current Characteristics and Reduced Electrostatic Discharge Susceptibility Application Type: Utility Patent Number: 6121077 ...
URL: https://www.src.org/library/patent/p0191/
Modified: 2000-09-19 - 21KB
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- 4:
Silicon-on-Insulator Transistors Having Improved Current Characteristi...
- Silicon-on-Insulator Transistors Having Improved Current Characteristics and Reduced Electrostatic Discharge Susceptibility Application Type: Utility Patent Number: 6300649 ...
URL: https://www.src.org/library/patent/p0219/
Modified: 2001-10-09 - 21KB
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- 5:
 Final Report - Workshop on Failure and Uncertainty in Mixed-Signal...
- National Science Foundation Workshop on Failure and Uncertainty in Mixed-Signal Circuits and Systems Arlington, Virginia July 8-9, 2010 Principal Investigators: Ralph Cavin, ...
URL: https://www.src.org/calendar/e004025/final-report.pdf
Modified: 2011-06-01 - 914KB
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- 6:
Methods, Apparatus and Computer Program products for Synthesizing...
- Methods, Apparatus and Computer Program products for Synthesizing Integrated Circuits with Electrostatic Discharge Capability and Correcting Ground Rule Faults Therein Application ...
URL: https://www.src.org/library/patent/p0049/
Modified: 1998-08-18 - 27KB
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- 7:
E003932 - Variability Forum - Gupta
- NanoCAD Lab Modeling Performance Impact of Variability Puneet Gupta Dept. of EE, University of California Los Angeles (puneet@ee.ucla.edu) Work partly supported by NSF, UC ...
URL: https://www.src.org/calendar/e003932/e003932_s2_2_gupta.pdf
Modified: 2010-06-29 - 1.4MB
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- 8:
3D IMAPS
- Tezzaron Semiconductor 05/05/2011 SRC 3D Summit Bob Patti, CTO rpatti@tezzaron.com 1 Tezzaron Semiconductor 05/05/2011 Why We Scale? 2 >180nm 90nm 65nm 130nm 45nm 28nm 22nm 16nm ...
URL: https://www.src.org/calendar/e004357/04-patti.pdf
Modified: 2011-05-04 - 4.4MB
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- 9:
E003932 - Variability Forum - Spanos
- 1 University of California . Berkeley . EECS . C. J. Spanos . 4/30/2010 Statistical Description of Process Variability First International Variability Characterization Workshop ...
URL: https://www.src.org/calendar/e003932/e003932_s2_1_spanos.pdf
Modified: 2010-06-29 - 2.8MB
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- 10:
TECHCON 2012 (Event E004114) - SRC
- TECHCON 2012 Date: Monday, Sept. 10, 2012, 8 a.m. - Tuesday, Sept. 11, 2012, 10 p.m. CT Location: Renaissance Austin Hotel, Austin, TX, United States Event ID: E004114 E004114 ...
URL: https://www.src.org/calendar/e004114/
Modified: 2013-03-11 - 98KB
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- 11:
Presentation Title
- PAGE 1 QUALCOMM CONFIDENTIAL AND PROPRIETARY QUALCOMM CONFIDENTIAL AND PROPRIETARY qctconnect.com 3D Through Si Stacking Technology - an IFM Perspective - RikoR May 11 PAGE 2 ...
URL: https://www.src.org/calendar/e004357/02-radojcic.pdf
Modified: 2011-05-04 - 2.4MB
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- 12:
E003932 - Variability Forum - Chuang_Su
- C. T. Chuang and P. Su, 04/2010 Variability and Design of SRAM in Scaled and Emerging Technologies Ching-Te Chuang and Pin Su Department of Electronics Engineering and Institute of ...
URL: https://www.src.org/...ar/e003932/e003932_s3_1_chuang_su.pdf
Modified: 2010-06-29 - 1.8MB
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